CSE Co.,Ltd
We pursue customer satisfaction. As you know, the Wafer Probing Machine is to test electric characteristics of each chip created on a wafer. The test is made by a probe of the probe card, attached to a wafer prober and connected to a tester, contacting to a pad of each chip of a wafer on the stage of the wafer prober. In testing this way, chips are sorted into either good or defective chips.
- +82-31- 765-3060
- +82-31- 765-3063
- brian@proberworld.com
- 121-9 Maejari-gil
Gwangju Si, Gyeonggi-do 464-893
Korea, South
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product
Wafer Test
Based on the reliability test, CSE conducts the test of the IC chip through electrical signals to the semiconductor wafer. We provide various Test Solutions according to the needs of designers/manufacturers. by sorting out good and bad products.
