Pulse Instruments
Pulse Instruments is a leading manufacturer of systems and equipment for characterization and production test of CMOS, CCD and IR image sensors, including science-grade devices. Science teams have used Pulse Instruments systems to extract maximum performance from several HST CCDs, including the chip in the most recently installed Advanced Camera System that is providing 10x the performance of its predecessor.
- (310) 515-5330
- sales@pulseinstruments.com
- 22301 S. Western Ave.
#107,
Torrance, CA 90501
United States
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CMOS/CCD Production Test System
System 1828
The basic system consists of a 225 MHz pattern generator, 10 clock drivers, 6 DC biases, 1-4 channels of 10 MHz 14 bit analog data acquisition and/or 1-4 channels of digital acquisition. Additional options can be added to customize the system to meet your requirements.
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Mainframes
Our CompactPCI series mainframes are industry-standard, open-architecture chassis with enhancements to support Pulse Instruments' clock driver and DC bias cards. The enhancements are transparent to the CompactPCI specification, and 3rd-party cards CompactPCI/PXI cards can be used in our mainframes without hardware or software modification*.
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Four Channel Low-Noise DC Bias Card
PI-41702
The PI-41702 is a four channel bipolar DC Bias supply that can provide an output current up to 100 mA per channel. The output voltage ranges from –8 V to +8 V, and this card has special filter circuitry to reduce the output noise for those applications that require a low noise bias output. Additionally there is a ‘D’ type connector that allows the introduction of laboratory type supplies to reduce the noise further. To change from using the internal power supplies to external power supplies requires repositioning jumpers. The PI-41702 also has voltage and current sense for remote measurement of the voltage and current levels.
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Pattern Generator
PI-2005
As a test engineer or digital designer you must have state-of-the-art tools to test, characterize and verify your complex semiconductor devices and digital circuit boards. The PI-2005 Pattern Generator will generate a wide range of simple or complex digital patterns for any test application that requires a serial or parallel digital data stream. To meet the requirements of complex devices and digital circuits, the pattern generator can be configured from 16 to 64 output channels.
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Instrument Mainframe
PI-11006
The PI-11006 Instrument Chassis was designed to accommodate the power and noise requirements of some of Pulse Instruments analog instrument cards. These instrument cards, such as the PI-41401, PI-41702 and others supply signal outputs that require more current from the -12 V supply than available in a standard chassis. Therefore this chassis has a larger -12 V power supply that provides 2.5 Amps.
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Instrument Mainframe
PI-11008
The PI-11008 Instrument Chassis was designed to accommodate the power and noise requirements of some of Pulse Instruments analog instrument cards. These instrument cards, such as the PI-41401, PI-41702 and others supply signal outputs that require more current from the -12 V supply than available in a standard chassis. Therefore this chassis has a larger -12 V power supply that provides 2.5 Amps.
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Clock Drivers
Multiple timing signals ("clocks") are required by CCDs, IR FPAs, and some CMOS image sensors to transport electrical charge across the array to a sense amplifier for conversion into image data. Pulse Instruments offers a line of "clock drivers" for generating these timing signals. The parameters of these clocks (clock rate, pulse width, pulse amplitude, rise- and fall-times, etc.) greatly influence the behavior and performance of the imaging device. Our products take logic-level inputs from a pattern generator and allow the user to adjust the output parameters to suit their device and testing requirements. Clocks can be "tweaked" in real-time to determine optimal operating parameters for a particular device, or else programmed in accordance with a test plan for automated production test.
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Dual Channel Clock Driver Card
PI-41400
The PI-41400 is a dual channel Clock Driver card capable of operating up to 190 MHz into a 50-ohm load and up to 80 MHz at an amplitude of 8 volts into a 1-megohm load. Into a high impedance load the output voltage range is from a –3 volts to 8 volts with the output pulse amplitude ranging from 0.5 V to 9 V. When driving a 50 load the voltage range is –1.5 volts to 4.5 volts with the output pulse amplitude ranging from 0.25 V to 4.5 V. The rise and fall times of the output pulse are variable from 1.2 ns to 9 ns into a 50-ohm load and <5 ns to 9 ns into a HiZ load. The output pulse amplitude and the load being driven determine the range of variability. The driver output can be set for tri-state operation and the output polarity can be set for ‘Normal’ or ‘Inverted’ operation through software.
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Low-Noise DC Bias
Imaging devices, such as CCDs, IR FPAs, and CMOS image sensors, require DC bias with very low electrical noise to prevent contamination of the image. Image quality can also be enhanced by carefully tuning each bias voltage to extract the maximum signal/noise ratio out of an array. Pulse Instruments has decades of experience providing DC bias supplies with the flexibility required tocharacterize and test a variety of devices while maintaining the noise immunity required for satellite and astronomy applications.
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Multi-Channel Data Acquisition System
PI-3105
This highly flexible system is designed to test a wide variety of imaging devices, from low-noise astronomy and medical devices, to military and machine-vision devices with GB/sec data rates.
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Software
Test and Control Software is also available for several of our products. All of our software is designed by Pulse Instruments for optimum flexibility and control. Please fill out the following form to request an evaluation copy.
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Data Acquisition
For devices with analog outputs, we are now shipping our new multi-channel data acquisition system. This high-speed, low-noise solution is highly modular, so you can test scientific CCDs and high-speed machine-vision CMOS sensors with the same basic system. Swappable pre-amps and A/D converter modules enable you to reconfigure your test system to fit your needs.
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Characterization System
System 7700
Whether your application is characterizing a massive mosaic of CCDs for the next great observatory, designing a faster FLIR for a weapons-guidance system, or production-testing a CMOS image sensor for a digital camera, Pulse Instruments can supply you with a fully-integrated test system that allows you to focus on your your device, not on your test system.
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Dual Channel Driver Card
40461
Two channels of 8 to 10 MHz drivers (25 V amplitude). The output voltage range is ±25V, with independent high and low voltage settings. The inputs to the Card are optically isolated. The card also contains voltage and current sense capability, which allows muxing of the current or voltage output measurements from all the Driver Channels in the system to a single DVM. The card allows independent programming of the rise and fall time of each channel as low as one nanosecond increments.
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Dual Channel Driver Card
42460
Two channels of 32 MHz clock drivers with up to 20 volt amplitude. The output voltage range is ±20 V, with independent high and low voltage settings. The inputs to the Card can be optically isolated. The card also contains voltage and current sense capability, which allows muxing of the current or voltage output measurements from all the Driver Channels in the system to a single DVM. The card allows independent programming of the rise and fall time of each channel one nanosecond increments.
