Cohu, Inc.
We are a global leader in test handling, thermal subsystems, package inspection, contactors and MEMS test solutions used by the semiconductor industry. We provide our customers with outstanding products and services that reflect our commitment to operational excellence, innovation and market leadership. Delta Design's engineering and manufacturing plant Cohu, Inc. was founded in 1957 and is comprised of three business units, Delta Design, Rasco and Ismeca.
- 858.848.8000
- 858.848.8180
- info@cohu.com
- 12367 Crosthwaite Circle
Poway, CA 92064
United States
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Diamondx DxV Test System
The Diamondx DxV semiconductor test system provides full ATE performance in a desktop PC footprint. Fully integrated, ultra-compact test system designed to be used in the engineering lab or office. Unlike traditional semiconductor tester solutions that is no mainframe, separate workstation or support cabinets needed. The Diamondx DxV is completely stand-alone, so it can be placed on a bench or desktop:
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Diamondx Test System
Diamondx semiconductor test system extends Cohu’s low-cost, high-throughput production test solution platforms to high pin count, higher site count wireless, mobility, SOC, Flat Panel Display drivers, Power Management, and microcontrollers. Designed to meet the cost drivers IC companies face, Diamondx extends Cohu’s leadership in lowering the cost of operations.
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Environment And Burn-in Temperature Chambers
Delta 9000 Series Temperature Chambers offer a wide choice of temperature ranges and capacities in addition to smart electronics. Field proven by satisfied customers for over four decades, Delta chambers are quality instruments that provide service longevity and integrity unique in their field. Over the years, Cohu has added advanced features to the proven basic chamber design and has refined system components and programming capability to deliver outstanding quality and value.
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Flexible Test And Scan Solution For FFC Devices
Ismeca NY32W
32-position turret test and scan platform for semiconductors on film-frame wafer media, providing the highest inspection yield for WLCSP and Bare Dies. Integrating innovative hardware and software technologies such as intelligent features that enable extended autonomous operation and productivity.
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Highest Demanding Finishing Processes
Ismeca NY32
32-position turret platform for semiconductor test, inspection and packaging, providing the highest process integration capabilities. Integrating innovative hardware and software technology such as intelligent features enables extended autonomous operation and productivity.
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Highest Throughput For Fragile Devices
Ismeca NY20
20-position turret platform for semiconductor test, inspection and packaging, provides the highest quality yield and throughput. It integrates innovative hardware and software technology such as intelligent features that enable extended autonomous operation and productivity.
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High Parallel Test Of Barometric Pressure Sensors
InBaro
InBaro MEMS module, a proven solution for accurate barometric sensor test with high throughput and stability.
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High Parallel Test Of Environmental Sensors
InHumid Test Module
InHumid sensor test system for final test of environmental sensors allows for high volume single-insertion test and calibration of integrated environmental sensors measuring pressure, temperature, humidity and gas.
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High Parallel Test Of Inertial Sensors Up To 6DOF
InFlip
InFlip MEMS strip-test module incorporates a modular architecture designed to replace expensive custom-designed machinery. It can operate in a standalone mode or it can be configured with a Cohu InStrip platform for full automation.
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High Parallel Test Of Inertial Sensors Up To 9DOF
InGyro Test Module
The InGyro sensor test module and functional test program for physical stimulation of inertial sensors under temperature conditions supports multiple target applications: accelerometers, gyroscopes, as well as multi-axis IMU’s (inertial measurement units) up to 9DOF (Degrees of Freedom). To meet the requirements of automotive and other demanding applications the temperature range the InGyro module supports testing at temperatures from -40°C to +125°C.
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High Parallel Test Of TPMS And Pressure Sensors
InPressure
InPressure HD module for high pin count pressure test up to 16 bar and fully supports high multi-site test of high pin count devices with up to 2,268 signal lines.
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High Performance Strip Handler
Rasco Jaguar
Jaguar is designed for high-volume production testing of ICs on a strip format or in device carrier. It is fully automotive qualified for tri-temperature test and the ideal solution for high parallel testing of small packages at short test times, but also for Power and Sensor devices. Due to the integrated vision alignment and high precision linear motors, Jaguar provides high yield and excellent OEE.
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High Speed Gravity Handler
MT9928 xm
This well-established test handler provides field-proven reliability and performance. Its modular and scalable design and variety of options allow configuration of the MT9928 exactly according to the test needs. Easy-access design and easy-to-change conversion kit parts support fast and easy package style changes. The MT9928 has a large soak capacity and features the entire tri-temp range at outstanding temperature accuracy and stability.
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Humidity And Gas Test
Cohu’s established humidity and gas test equipment provides a high-volume final test solution for either humidity or gas sensors. The same equipment can be used to test a combo device of both humidity and gas in a single insertion.
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Magnetic Sensor Test
Cohu offers a big variety of magnetic test solutions applying magnetic field in all three dimensions. Depending on the requirements we can integrate coils with and without magnetic core, single- or Helmholtz coils, as well as permanent magnets, static and rotating.