Handling Solutions
Test at any scale, at any stage of the innovation process. Explore our portfolio of application-specific solutions
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Intelligent Thermal Control
As AI processors and high-performance compute devices are manufactured with leading-edge process technology nodes and advanced heterogeneous packages with chiplets, the overall cost of test to provide the highest quality of the final package is increasing significantly.
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System Level Test
SLT
As technology nodes continue to evolve and with a more aggressive time to market to bring devices to their end applications, full test coverage of such chips is possible only with System Level Testing.
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Wafer Test Solutions
Wafer Test Solutions has established leadership positions in developing and deploying application-specific test solutions for MEMS devices, offering wafer and frame probing stations suitable for R&D, Wafer Sort, and Final Test. We offer state-of-the-art solutions to test environmental and motion sensors in wafer and other advanced packages.
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ATOM Handler
The ATOM-IC Handler is a benchtop handler designed for use on engineering test floors and in development operations. Its innovative design allows for maximum flexibility and minimum cost and maintenance.
