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Probe Systems
use programmable motorized staging to position contacting pin s.
See Also: Probe Stations, Flying Probes
- Pickering Interfaces Inc.
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Modular Breakout System 8-Pin Power D-type Plugin Module for 40-193
95-193-001
The 95-193-001 Plugin Breakout Module is designed to be fitted to a PXI 40-193 Fault Insertion Switch as part of the Pickering MBoS. The Modular Breakout System is designed to Simplify HILS (Hardware In the Loop Simulation) Applications.
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Battery Cell Formation System
17000 series
Chroma 17000 series is specifically designed for the formation of Lithium Ion and Lithium Polymer secondary batteries. The 17000 series is a complete turn-key system, including carrier trays, robust battery probe contacts, high quality charge/discharge modules and intuitive software all under computer control. Patented Battery Voltage Tracking (BVT) DC-DC conversion power modules minimize power consumption in battery charging, and Energy Recycle Modules (ERM) recycle the discharged energy directly back to the DC power system for increased power efficiency. These power saving designs provide a planet friendly solution along with cost savings by reducing energy consumption. The intuitive software provides a flexible selection in the charge/ discharge channel, current rating, and modules under test. These features allow the Series 17000 to be used for final cell development, pilot line production, high volume production and ongoing reliability monitoring/quality control.
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Probe Systems
These flexible probe stations are designed for the ever-changing test configurations required in a engineering lab. Combined with durable probes or your own high-speed probes, PacketMicro probe stations are the most cost-effective probing solutions in the industry.
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DisplayPort v1.3 Protocol Analysis Probe
FS4500
The FuturePlus FS4500 DisplayPort Analysis Probe provides a mechanical, electrical and software interface to the DisplayPort bus, a digital display interface standard supported by the Video Electronics Standards Association (VESA). The FS4500 is used to design and debug computer motherboards, monitors, home theater systems, and silicon chips incorporating DisplayPort technology.
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Temperature Meters
PCE Instruments’ temperature meter products are precise, portable, handheld devices ideal for professional, industrial, commercial and residential use. From contact temperature meter devices with probes to noncontact temperature meter devices using infrared or laser technology to measure temperature from a distance, PCE Instruments offers a wide range of accurate, reliable temperature meter products at an affordable price.Temperature is measured and recorded in many different applications. For example, HVAC technicians measure temperature to identify and address issues in heating or cooling systems, while quality control professionals in the food sector measure temperature to ensure the proper storage and preparation of everything from meat and produce to cheese and frozen foods. PCE Instruments carries a variety of temperature meter products, including temperature meter devices to measure different temperature ranges between -200 and 1767ºC / -328 ... 3212ºF; temperature meter devices that can indicate temperature in °C (Celsius), °K (Kelvin) and °F (Fahrenheit); and temperature meter devices that are water resistant. In addition, a number of thermal elements and type-K sensors are available for different temperature meter products.Each temperature meter comes factory calibrated to ensure accurate measurement. ISO-certified calibration, performed by one of our first-class calibration laboratory partners, may be obtained on most temperature meter models for an additional fee.A temperature meter is an instrument used to measure the temperature of beings or things. The most widely recognized temperature meter is a mercury thermometer used to measure the temperature of people. These thermometers consist of a graduated glass capillary with a pool of mercury in one end. However, there are many different types of temperature meters, such as digital thermometers that take temperature measurements on contact with an object or infrared temperature meters that take measurements at distance, without contact.
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Fully Automatic Non-contact Sheet Resistance Measurement System For Flatpanel Display
NC-60F/RS-1300N
*Global standard for non-contact measurement of ITO film, Metal thin films on flat panel*Automatic X-Y and Z (eddy current probe head) axis moving mechanism*Compatible with Loading robot for fully automatic measurementOption :*Integlate to combined system (film thickness meter, etc)*Add 4 point probe measurement unit : RT-3000
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Dilution-Extractive System
ML675
The Teledyne ML®675 dilution-extractive system can be used in 40CFR75, 40CFR60, 40CFR63, and process control applications. In this system, sample is prepared for analysis by diluting stack gas with clean, dry instrument air at the probe location. Since no moisture is removed with dilution, measurements for SO2, NOx, CO, THC and CO2 are made on a wet basis.
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Near Field Microprobe E-field 7 MHz to 3 GHz
ICR E150
The near field microprobe is used to measure electric fields at extremely high resolution and sensitivity. The optimal distance to the object being measured is < 1 mm. Due to its small probe head dimension, the probe has to be moved by a manual or automatic positioning system, e.g. Langer-Scanner.
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Probe System for Life
PS4L
The Probe System for Life, or PS4L, is SemiProbe’s patented adaptive probe system architecture. Unlike traditional probe systems, all of the basics components of our systems, including the bases, stages, chucks, microscope mounts, and manipulators, are interchangeable, upgrade-able, and configurable. The PS4L Adaptive Architecture ensures and optimal test configuration for each individual customer application.
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DH Series High-Sensitivity Solder-In Tip, 30 GHz BW, 2.0 Vpp Range
DH-SI-HS
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
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DC Meters/Rail Meters:
Digital DC Resistive Voltmeter has a single range of 0 – 2kV. The unit consists of a meter probe, second probe, and connector cable. This unit is designed to measure DC voltage between the negative return rail and overhead positive cantenary conductor used on transit systems. The five position selector switch located on the face, controls OFF, ON, and Test. The OFF positions are for storage and transit. The ON position is for measurements from 0 to 1999 volts with one-volt resolution. The T position tests basic meter functions and the digital display.
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HVAC/R Environmental Meter
FLIR EM54
The FLIR EM54 is ideal for inspecting and troubleshooting HVAC/R ducting systems within residential, commercial, and industrial facilities. This meter can help you verify that duct inlets and outlets have the specified volumetric flow – a prerequisite to an efficient functional system. Featuring humidity, wet bulb, and dew point functions, the EM54 can measure deviations from proper relative humidity levels. Plus, the included Type-K contact temperature probe is useful to check electric motors and thermal equipment components for proper operating temperatures.
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Manual Fixture Kit With Mass Interconnect Cassette Interface, Max number of probes (2N) 1000 units, Max UUT 580 x 250 mm (wxd)
CMCSK-03-01
Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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Exchangeable Test Fixture
MA 2111/D/H/S-5
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 850Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 9,30 kg
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Exchangeable Test Fixture
MA 2112/D/H/S-7/HG/KT-ITA-21
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 16,30 kg
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Eddy Current Probes and Drivers
Proximity sensors work on the eddy current principle. A proximity system consists of an eddy current probe, extension cable and driver. A high-frequency RF signal is generated by the driver, sent through the extension and probe cables and radiated from the probe tip. The tip consists of a precision wound copper coil inside a chemical and temperature resistant PEEK case.
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Resistivity Meter for Concrete
Ohmcorr Test System™
OhmCorr has two probes spaced 1.97" (5cm) apart which are placed in holes drilled to a depth of 3/8th" (8mm) and filled with conductive gel. The direct digital read-out of resistivity is displayed on the LCD when the control switch is activated. OhmCorr and CorMap, when used together, provide an economical and sound diagnostic system of corrosion in reinforced concrete.
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Semi-Automated Probe Stations
SPS 2600, SPS 2800, and SPS 12000 Series
The SPS 2600, SPS 2800, and SPS 12000 Series systems are MicroXact’s semi-automated probe stations designed to be flexible and easy to use when performing high productivity device characterization, wafer level reliability testing and failure analysis. These semi-automatic probe station systems are designed to support manual and semi-automatic probing of up to 200mm wafers.
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DDR4 X16, 2-Wing, Small KOV, BGA Interposer For Logic Analyzers
W4636A
The W4636A DDR4 x16 – 2 wing BGA interposer for 96 ball DDR4 DRAM is designed for data rates up to and including 2.4 Gb/s. The W4636A probes all ADD/CMD/CNTRL and partial DQ/DQS, and it is designed for minimal KOV for space limited systems under test. The W4636A is the least expensive DDR4 BGA interposer for a logic analyzer.
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6-24V Car Circuit Tester
1954
Peaceful Thriving Enterprise Co Ltd
Check on 6-24V system. The alligator (earth) clip is suitable earth and the tip of the contact probe is placed onto the part to be used. If current is present the test light will glow.
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Tooling And Fixturing
Control develops and supplies fixtures and test accessories :*For a vast field of applications - ICT (In-Circuit Test), functional test, Flash programming, EoL (End-of-Line) test systems, etc.*For all handling systems currently used in the market: online or offline, mechanical, pneumatic or vacuum operation*From simple mechanical fixtures, with a few hundred probes and low production volumes, to highly complex accessories with thousands of probes, double-sided probes, double acting, etc.
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Advanced Circuit Card Automated Test
ACCAT
The ACCAT is designed to support diagnostic and acceptance test requirements across a wide spectrum of testing parameters. ACCAT provides a suite of core parametric test instruments, advanced GUI based software, Huntron Access Robotic probing and Huntron Analog Signature Analysis (ASA). ACCAT provides stimulus and asurement capabilities necessary for full functional and parametric testing of circuit card assemblies along with robotic guided probes for fault verification and debug. The Huntron ASA test is ideal for pretest or safe to power up procedures protecting the integrity of the test system.
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MPI Fully Automatic Probe Systems
MPI Advanced Semiconductor Test
Addressing the RF and High Power communication devices and discrete passive components production test market requirements, MPI introduced the TS2500 200 mm fully automatic probe system series. The system is based on industry leading production equipment from the Photonics Automation Division and incorporates decades of experience in RF and High Power measurement techniques from the MPI’s Advanced Semiconductor Test (AST) Division in combination with other AST products such as RF Probes, related calibration technology, and High Power accessories.
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Substrate Inspection Apparatus
The test system of the printed circuit board (mounting board) called the flying probe tester developed ahead of the world received high evaluation at the electronics manufacturing factory around the world, securing the top share of the industry and "Takaya of the board tester" We have established a firm position that.
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Insulation Resistance Tester For PV (Judge Deterioration Point)
MIS-PVS
MULTI MEASURING INSTRUMENTS Co., Ltd.
The model MIS-PVS is an insulation resistance tester for the exclusive use in photovoltaic systems. The ordinary insulation resistance testers cannot make measurement properly during generation of PV systems. This instrument, however, can measure the insulation resistance simply by touching probe to the live line whether making generation or not. There are two ranges of PVH and PVL. PVH is for high voltage generation system (more than 500V and less than 1000V) and PVL is for the system less than 500V.
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PCI Express Card Slot Interposer
PCIE850
The PCIE850 provides a complete test and debug solution for PCI Express Bus. Interposers and probes connect to the PCIE850 providing access to PCI Card, AMX, XMC and VPX systems.
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Residual Gas Analyzer
Models XT100, XT200, XT300
The XT residual gas analyzer (RGA) from Extorr offers exceptional performance and value. These RGAs provide a more detailed vacuum gas analysis than is offered by any other single competitive device. Each system comes complete with a multi-gauged quadrupole probe, a control and communications unit (CCU), and a real-time Windows software package.
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Manual Flying Probe Test Systems
They provide flexible measurement technologies like Kelvin and high voltage tests in combination with low tooling costs. atg Luther & Maelzer offers a wide range of different systems starting from standard systems with 8 heads up to oversized systems with 24 test heads.
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PCI Express Bus Analyzer / Exerciser / Endpoint
The PCIE850 provides a complete test and debug solution for PCI Express Bus. Interposers and probes connect to the PCIE850 providing access to PCI Card, AMX, XMC and VPX systems.
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Manual Fixture Kit
230372 – CMCSK-03-01
Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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USB Sound And Vibration Measurement Bundle
The USB Sound and Vibration Measurement Bundle provides a portable, USB-based sensor measurement system that helps you measure signals from integrated electronic piezoelectric (IEPE) and non‑IEPE sensors such as accelerometers, tachometers, and proximity probes.