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- Pickering Interfaces Inc.
product
PXI/PXIe MEMS RF Multiplexer, Dual 4-Channel, 4GHz, 50Ω, MCX
40-878-222
The module is based on the latest micro-electromechanical system (MEMS) switching technology and has low insertion loss and VSWR. In addition, MEMS devices have a long operational life of >3 billion operations and benefit from an operating time of <20 μs allowing greater test system throughput. The multiplexers have excellent and repeatable RF characteristics beyond 4 GHz with each path having a nominally equal insertion loss.
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ATE Self Test Fixtures
AL663
AL663 fixtures include all the electronic parts required to perform an effective test platform diagnostic. The AQ818 device allows to perform a series of tests, obtaining a report of the faulty instruments or switch modules and also a report about the relay contacts estimated life.
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High Speed Test Bench
AT444
AC motor with mechanical multiplying gearbox test benches allow precise programming of all drive parameters required for accurate rotating devices test.The use of special high-speed bearings, mechanical components and parts wear resistant leads to a large life. The supply includes the electronic drive and control as well as the entire oil cooling unit.
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In-Circuit Test System Repairs
Forwessun provides expert repair services for a wide range of Test Systems, helping you maintain optimal performance and extend the life of your equipment. Our team of skilled technicians quickly identifies and addresses issues, ensuring that your system is back in operation with minimal downtime. We handle both routine and complex repairs, offering comprehensive solutions to keep your systems running efficiently and reliably.
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Highly Accelerated Life Testing (HALT)
Quickly validate reliability and identify manufacturing defects that could cause product failures in the field with MET’s Highly Accelerated Life Test (HALT)HALT technique uses a combination of accelerated stresses to expose product flaws early in the design and manufacturing stages, which improves product reliability and customer confidence inherent to the design and fabrication process of a new product as well as during the production phase to find manufacturing defects that could cause product failures in the field.
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Spectrum Analyzers
A refurbished spectrum analyzer is the best solution if you are looking to stretch your budget. The spectrum analyser is typically a more expensive piece of test equipment when compared to other general purpose test instrumentation. Depending on your test needs and budget a new spectrum analyzer may be the preferred choice. We have a very wide selection for you to choose from and a product for every budget.A spectrum analyzer is found in three basic forms, bench top, handheld, and portable. The spectrum analyser enjoys a long useful life and good resale value because of its fundamental use, the measurement of the spectrum of a signal. Microprocessor speeds change but frequencies do not. Basic and real time signal and spectrum analysis is always a test need especially now given the wireless world we live in. As wireless consumer and industrial devices continue to come on the the market, the spectrum analyzer can be found in more and more design, in house test, manufacturing, quality, field test, and remote repair applications.Test Equipment Connection offers Spectrum Analyzers in a various range of prices and categories, allowing you to find the equipment you need. Search by Frequency, number of channels, brand or price range. Test Equipment Connection has made it easy to find the equipment that is right for you.
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Digital (1kV up) H.V. Insulation Tester
6213A IN (Ranges: 0.5kV to 10kV 0.5kV increment steps)
Standard Electric Works Co., Ltd
● Microprocessor-controlled.● 2 ×16 characters; large intelligent LCD module.● 20 Insulation test voltages 500V, 1kV, 1.5kV, 2kV, 2.5kV, 3kV, 3.5kV, 4kV, 4.5kV, 5kV, 5.5kV, 6kV, 6.5kV, 7kV, 7.5kV, 8kV, 8.5kV, 9kV, 9.5kV, 10kV.● Ener-Save™ feature to extend battery life.● Bar-graph indicates test voltage; rise and decay can be observed.● Visual and audible warning if external voltage is present (>500Vac or Vdc.)● Insulation resistance; auto-ranging on all ranges.● Overload protection.● Low battery indicator (read time battery voltage measurement).● Measures insulation time duration of the test.● Low battery consumption.● Better than 10% accuracy on all ranges.● Auto-off.● Calculates Dielectric Absorption Ratio (DAR) automatically.● Calculates Polarization Index (PI) automatically.
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Probe System for Life
PS4L
The Probe System for Life, or PS4L, is SemiProbe’s patented adaptive probe system architecture. Unlike traditional probe systems, all of the basics components of our systems, including the bases, stages, chucks, microscope mounts, and manipulators, are interchangeable, upgrade-able, and configurable. The PS4L Adaptive Architecture ensures and optimal test configuration for each individual customer application.
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Low Temperature Operating Life (LTOL) Test
LTOL
LTOL is being more used more and more frequently by manufacturers of low geometry devices as part of the qualification process, and in order to gain more failure data, a greater understanding of different failure modes of the device at low temperature, and to enable more complete reliability estimations. As device geometries decrease and frequencies become higher, Hot Carrier Injection (HCI) increases and the resulting degradation causes the deterioration of device characteristics and ultimately leads to failure.
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Corrosion Testing
The salt spray test is a standardized test method used to check corrosion resistance of coated samples. Coatings provide corrosion resistance to metallic parts. Since coatings can provide a high corrosion resistance through the intended life of the part in use, it is necessary to check corrosion resistance by other means. Salt spray test is an accelerated corrosion test that produces a corrosive attack to the coated samples in order to predict its suitability in use as a protective finish.
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CAM/TRAC Test Kits
Series 40
The CT Series 40 CAM/TRAC mechanical kits, utilizing the patented CAM mechanism, offer precise Z axis linear motion when testing higher point count and finer pitch test centers. By using the Z axis motion, side load of the test probes is minimized thus increasing probe life and performance.
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Microcomputer Three-phase Relay Test Set
Weshine Electric Manufacturing Co., Ltd
Given the diverse functional requirements of the grid’s protection system, testing capabilities require a new level of sophisticated test hardware and software with which to analyse the entire protection system’s (or individual protection component’s) operation in "real life" situations.
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Passive Oscilloscope Probes
5900 SERIES
Probe Master's new 5900 series passive oscilloscope probes are available in 400 MHz & 500 MHz bandwidths. Probes are also available with readout actuators for oscilloscopes with the readout feature. The "GOLD PROBE" has been designed specifically for use with Tektronix, Hewlett Packard and other high performance oscilloscopes. This new slim design along with a host of versatile accessories, allows you to reach the most difficult test point in today's highly complex circuitry. The gold plated Probe Tips, Sprung Hook, Ground Lead, Alligator Tip and other critical interconnect points within the Gold Probe, provide excellent contacts for probing low level analog signals and high speed digital data. Unlike most "off shore" commodity probes, Probe Master guarantees quality and continuing domestic support for our "Made in America" Gold Probe.The probe body is made of high impact ABS. Soft molded strain reliefs at all stress points assure long cable life. In short it has been designed to offer you high performance coupled with high quality.
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Process Thermal Conductivity Analyzer
CI-IN56
Shanghai ChangAi Electronic Science & Technology Co.,Ltd
CI-IN56 thermal conductivity analyzer is a kind of intelligent analyzer based on microprocessor, considering microprocessor thermal conductivity sensor as measuring unit. It has high accuracy, good stability, comprehensive function and long service life. Applied to test the H2 or He in binary gas or binary mixture gas. - See more at: http://en.ci-ele.com/dcb675d2-4e33-4eb9-33a0-60edf78c9348/6b085f77-cb25-8ccc-faaf-9b581710d730.shtml#sthash.Xs2anvsw.dpuf
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SSP Switch Probes
Current Rating (Amps): 5Average Probe Resistance (mOhm): 50Spring Force Remark: Force at switch point: 2.36 (66)Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 150Full Travel (mm): 3.81Recommended Travel (mil): 100Recommended Travel (mm): 2.54Mechanical Life (no of cyles): 100,000Overall Length (mil): 1,210Overall Length (mm): 30.73Switch Point (mil): 25Switch Point (mm): 0.64
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OLED Lifetime Test System
58131
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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PXI/PXIe MEMS RF Multiplexer, Single 4-Channel, 4GHz, 50Ω, MCX
42-878-212
The module is based on the latest micro-electromechanical system (MEMS) switching technology and has low insertion loss and VSWR. In addition, MEMS devices have a long operational life of >3 billion operations and benefit from an operating time of <20 μs allowing greater test system throughput. The multiplexers have excellent and repeatable RF characteristics beyond 4 GHz with each path having a nominally equal insertion loss.
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Standard 1.10 (31.00) - 3.85 (109.00) General Purpose Probe
HPA-64-4
Current Rating (Amps): 3Average Probe Resistance (mOhm): 50Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 50Full Travel (mm): 1.27Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 375Overall Length (mm): 9.53Overall Length Remark: Exact length depends on selected tip: Tip 1,4, 7: 0,375″; Tip 2,3,9,10: 0,365″; Tip 8: 0,385″
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Boundary Scan Products
Acculogic offers a powerful suite of PC-based hardware and software tools specially designed for testing of electronic devices, boards and systems using the IEEE1149.1 and IEEE1149.6 standards. Acculogic’s comprehensive line of Boundary Scan Test tools can be effectively used in the entire product life cycle, starting with design verification and validation and continuing into pilot production and manufacturing. Use of these tools in field service and repair depots can help further to reduce test cost and cycle time.
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Optical Switch
FTBx-9150
With crosstalk of –80 dB and life expectancy of 10 million cycles, the FTBx-9150 Optical Switch is ideal for bidirectional component testing, ribbon fiber testing, multichannel monitoring, remote and multiple-component testing, signal routing and bypass switching. Housed in the LTB-8-based test systems, the FTBx-9150 provides highly accurate and repeatable fiber-to-fiber switching. It offers a choice of 1x2, 1x4, 1x8, 1x12, 1x16, 1x24, 1x32, 2x2 and 2x4 configurations. Designed for minimal reflectance, the switches integrate precision optical components into a compact modular package. Both singlemode and multimode versions are available and offer a solution for all your optical switching needs.
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PXI/PXIe MEMS RF Multiplexer, Single 4-Channel, 4GHz, 50Ω, MCX
40-878-212
The module is based on the latest micro-electromechanical system (MEMS) switching technology and has low insertion loss and VSWR. In addition, MEMS devices have a long operational life of >3 billion operations and benefit from an operating time of <20 μs allowing greater test system throughput. The multiplexers have excellent and repeatable RF characteristics beyond 4 GHz with each path having a nominally equal insertion loss.
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AstroAI Digital Clamp Meter
Check out our VIDEO on the left side and take a quick tour of AstroAI Multimeter! TEST A WIDE RANGE of measurements including AC/DC Voltage, AC Current, Resistance, Continuity; Also Tests DiodesQUALITY DESIGN features a sampling speed of 2 times per second; Auto off conserves battery life and increases the lifespan of your multimeter
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Drop Weight Impact Testing Machine
DWTT Series
Jinan Testing Equipment IE Corporation
DWTT Drop Weight Impact Testing System is suitable for drop weight tear test of various kinds of ferrite, especially for the test of DWTT for pipeline steel as ASTM-E 436, API-RP 5L3, ASTM-E 208 and DIN EN 10274. DWTT has integrated mechanical, electrical, and automatic control technology, and achieved full automation of feeding, hammer lifting impact, and fracture specimen collection. The load frame has a four-column design, features in stable supporting structure, rigid, dual sliding rails. The Drop Weight Drop Weight Tester is equipped with positioning mechanism, anti-dumping mechanism, safety mechanism, hydraulic buffer devices and security guard net. The impact energy is determined by the lifting height and configuration of different net weights. DWTT Drop Weight Impact Testing System is the essential quality control equipment for pipeline manufacturers, steel mills, iron and steel enterprises, and is also widely used for research institutes.1. Buffer device is equipped to avoid the second impact and absorb the residual energy after breaking the specimen so as to prevent the weigher and anvil from destroying. The installation of safety mechanism, buffer device, and security guard net will effectively secure the testing machine and its operation to extend its life.2. Configuration of the specimen-feeding system, anti-second impact device, and specimen centering mechanism will guarantee a quick, accurate and reliable test.
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Test Executive & Development Studio
ATEasy
ATEasy is a test executive and a rapid application development framework for functional test, ATE, data acquisition, process control, and instrumentation systems. ATEasy provides all the necessary tools to develop, deploy and maintain software components - including instrument drivers, test programs, and user interfaces, as well as a complete and customizable test executive. It is designed to support and simplify ATE system applications with long product life cycles. With ATEasy, test applications are faster to generate and easier to maintain.
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Test & Measurement Cables
Our test & measurement cables provide customers with a competitive edge over ordinary cable designs by addressing three important criteria for testing electronic components and systems: phase stability, insertion loss stability and repeatable measurements for the cable’s useful life.
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3 Wire (Analogue) Earth Resistance Tester
1105 ER
Standard Electric Works Co., Ltd
● Capable of measuring earth resistance and earth voltage.● 2mA measuring current permits the testing of earth resistance without tripping earth leakage current breakers in the circuit under test.● In addition to facilitating for precision measurement, test leads for simplified two-wire measuring system also are supplied as standard accessories.● Battery operated.● Battery life indicator. ● Calibration performed with supplied test leads.
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6/8/12 Volt 0-1000 Amp Heavy-Duty Variable Carbon Pile Load Tester
7136R
• High-volume testing and fleet use• Tests 6/12 Volt batteries• 1000 Amp load; tests batteries up to 2000 cold cranking amps• Built in LCD Digital Voltmeter and LCD Digital Amp Meter• Cools with high RPM fan for continuous battery testing• High resolution carbon pile assembly for smoother operation and longer life• Optional Model 6038C for added mobility with convenient heavy-duty cart with wheels• RoHS and CE Compliant• Made in USA of US and Global Components
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Power Cycling Semiconductor Life Test System
ITC52300
The ITC52300 is designed for high-volume intermittent or steady-state operating life testing on Insulated Gate Bipolar Transistors (IGBTs), power MOSFETs, diodes, and other bipolar devices in a production environment. (The ITC52300 is an enhanced version of the ITC5230.)
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6 Position Plug Socket Switch Life Tester
CZKS-6
It is designed according to terms and conditions of IEC60884-1, IEC60669-1, GB2099.1-2008 and GB16915.1-2003, for life test of plug and socket and switch products of household and similar use appliances. The device can connect with matched load cabinet, in order to conduct a test of electrical life, normal operation and breaking capacity. The equipment provide some clamp, it can test plug and socket production, wall switch, rocker switch, dial plate switch and button switch.
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Constant Temperature Humidity Test Chamber
Constant Temperature and Humidity Test Chamber from Weiber are environmental test chambers, designed to simulate constant climatic conditions for testing a wide variety of products for their quality, performance, shelf life and stability. They are used to simulate constant temperature and humidity conditions, thereby creating a physiologically ideal environment for product testing. These equipments are most commonly employed for testing electrical devices, electronic parts and components, instruments, biological samples, food items and other manufactured and processed goods and find widespread usage in scientific research organizations, semiconductor industries, material research institutes and other industrial and manufacturing units.
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HPA-64 General Purpose Probes
Current Rating (Amps): 3Average Probe Resistance (mOhm): 50Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 50Full Travel (mm): 1.27Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 375Overall Length (mm): 9.53Overall Length Remark: Exact length depends on selected tip: Tip 1,4, 7: 0,375″; Tip 2,3,9,10: 0,365″; Tip 8: 0,385″
