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- Pickering Interfaces Inc.
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PXI Resistor Module Dual 16 Bit With 16XSPDT Relays
40-290-121
The 40-290 Series Programmable Resistor Modules comprise a Dual 16-bit or Quad 8-bit resistor chain together with 16 optional SPDT Reed Relays. Connections are made via a front panel SCSI 2 type 68 pin male connector. Programmable resistors may be connected together either in series or in parallel to form many types of configuration.
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HIGH FREQUENCY DC BIAS
6565 SERIES
The 6565 HF DC Bias Unit is intended to be used with a Wayne Kerr 6500 analyzer, either the 6500B Precision Impedance Analyzer or the 6500P HF LCR Meter. Its function is to provide a source of DC bias current through the Device Under Test (DUT) while the analyzer is making AC measurements. Each 6565 unit can provide up to 10 A of DC current, and up to six 6565 units can be connected in parallel to supply a maximum 60 A. A digital ammeter on the front panel allows the user to see the dc bias current value and an indicator LED shows when the bias current is enabled.
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Ultrasonic Thickness Gauge
UTG-1500
The new PHASE II UTG-1500 is a hand held microprocessor controlled ultrasonic thickness gauge specifically designed for measuring the thickness of metallic and non-metallic materials such as aluminum, titanium, plastics, ceramics, glass and any other good ultrasonic wave-conductor as long as it has parallel top and bottom surfaces.
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Parallel Test Systems
Our parallel test systems for research and development are highly flexible in use and easily adaptable to different tasks as well as changing piezoelectric materials and designs.
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Solid State Relays for AC Power Switching Applications Requiring High-Rel and High Safety
Series KA/LA
Series KA/LA solid-state relays are designed for use in AC power switching applications where safety and reliability are primary concerns. They are ideal for resistive and reactive loads with power factors as low as 0.2. Inverse parallel SCRs are configured for zero-voltage turn on. The relays are available with thermal protection and thermal trip status.MSL 1 Available options include:KA58HF 2Arms, 250Vrms Load; 3.8-32Vdc bias voltage, 250µA CMOS Control; includes thermal protection & thermal trip statusLA00HL 2Arms (7.5Arms with heat sink), 250Vrms Load; 3.8-32Vdc bias voltage, 250µA CMOS Control; LA58HL 2Arms (7.5Arms with heat sink), 250Vrms Load; 3.8-32Vdc bias voltage, 250µA CMOS Control; includes thermal protection & thermal trip status
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AXIe Logic Analysis & Protocol Test
Keysight's AXIe Modular Logic Analysis and Protocol test modules and powerful analysis software provide essential capabilities for engineers working on fast digital designs and chipsets using high speed parallel and serial buses, such as DDR and PCI Express Gen 3.
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Massively Parallel Board Test System
I7090
The Keysight i7090 is a massively parallel board test system designed to help PCBA test engineers improve manufacturing efficiency while reducing costs. Unlike traditional in-circuit testers, the i7090 supports up to 20 In-Circuit Test cores in parallel, which means engineers can test multiple Units Under Test (UUTs) simultaneously without the need for multiple systems. This reduces scaling and infrastructure costs and frees up valuable testing space.
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Serial To Digital Interface MiniBox™
ICS's 2363 Serial Digital Interface provides a fully enclosed parallel interface that is suitable for benchtop or rack mount applications. OEM board versions available for inclusion in test chassis.
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IP Parallel HV
High Voltage [up to 30V] IP Compatible card with 48 programmable IO. 40 mA sink. Open collector interface. Interrupt generator on each input channel. Filtered or direct input.
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ICT - Flexible Multi-Core Parallel/Merged-Core Tester
TR5001 SII QDI SERIES
• Flexible Multi-Core Parallel / Merged-Core Tester• Serial Test Controller with up to 8 ports on any pin• Light - Curtain Protected Press - Down Platform• PXI Ready• Built-in Self Diagnostics and Auto-Calibration function• High-Accuracy Measurement• Flow - based Easy Program Development
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Image Sensor Test System
IP750
Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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Becker Transponder Test Fixture
TA-3400
This transponder test fixture is specific to the requirements for testing Becker Avionics Transponders and provides interface connectors for both the panel mount and remote systems. The panel also provides switches to implement Gillham code altitude as well as separate interfaces for an external parallel or serial encoder. The panel will interface with the RMU 5000 or standard control head. This fixture also comes with voltage and current meters along with an internal dimming source. This panel comes in the standard 19 inch rack width and measures 12 inches in depth.
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Probe Cards
Direct Dock
Direct dock style wafer probing allows for a higher bandwidth, increased pin density and testing more devices in parallel. Direct dock probe cards also support the growing movement of traditional final test to wafer probe which allows for known good die (KGD) and reduced cost of ownership.
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Camera Modules
e-con Systems Camera Modules come with parallel & MIPI interfaces. Our CMOS camera modules will be effective in any application or environment because of their versatility and wide range of options. Embedded camera module can be interfaced to processors like Tegra K1, i.MX6, DM3730, OMAP. Further to these HD camera modules, e-con offers evaluation boards with these camera modules interfaced to various development boards featuring these processors. We provide Omnivision Camera Module & Aptina Camera Module (ON Semiconductor) with CMOS Sensors.
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Test Database Software Module
The relational test database is the pivotal point of the software structure. On one hand, this is where the test applications and test systems used for productive testing are stored; on the other hand, it provides the storage space for all DUT-related test data. Depending on customer requirements, the test database may either be hosted locally on the test system or centrally on a server, supporting several test systems. The database performance is sufficient for a high-volume production environment with many test systems which access the central database in parallel. LXinstruments prefers to implement the database as a license-free MySQL database; it is however also possible to realize a version based on Microsoft SQL.
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QW-AddIn For Autodesk® Inventor® Software
QW-AddIn for Autodesk® Inventor® Software is a QuickWave plug-in for Autodesk® Inventor® Software, a wide-spread mechanical tool, allowing defining a complete project for electromagnetic simulation, also periodic structures and axisymmetrical structures (V2D), directly in the popular CAD environment. A set of self-explaining dialogues provides very convenient tool for setting the electromagnetic properties such as assigning the materials, adding ports, boundary conditions, setting postprocessings and excitation parameters.Automatic mesh generation using Automatic Meshing Intelligent Generation Option (AMIGO) optimises the meshing taking into account requested wavelength resolution in all media, while avoiding unnecessarily small cells. Additionally QW-AddIn for Autodesk® Inventor® Software can be used for optimisation and parameters sweep with QW-OptimiserPlus.QW-BHM is available and heating parameters can be defined together with rotation in XY plane along axis parallel to Z axis. Creating proper axis of rotation can be done by selecting edge or solid body from the project. It will contain the middle point of selected object and its location can be modified either with the mouse or by entering new coordinates.
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1 KN Eccentric Roller Grips
These eccentric roller grips are specifically designed for tensile testing flexible materials, such as rubber and soft and semi-hard plastics. Named after the non-symmetric roller design, these grips employ a simple and quick clamping mechanism. They also have a self-tightening action, which maintains clamping of the specimen during testing regardless of any thickness reduction. In addition, the upper and lower grip faces are parallel grooved to help hold these soft materials.
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Exchangeable Test Fixture
MA 2111/D/H/S-5
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 850Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 9,30 kg
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Exchangeable Test Fixture
MA 2112/D/H/S-7/HG/KT-ITA-21
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 16,30 kg
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Rugged Convection Cooled System with Intel® Xeon® Processor and MIL-DTL-38999 Connectors
HPERC-KBL-MH
Inside the tiny footprint of ADLINK’s HPERC lives the power of Intel® Xeon® processor and optional GPGPU parallel processing engine based on a NVIDIA Quadro MXM module. Dual removable secure erase RAID-0 SSDs provide 12Gb/s throughput and security for deployment in hostile environments.
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COMINT Monitoring System
A modern COMINT system can handle thousands of parallel signals. With a reliable and intuitive management software, the increased situational awareness creates a firm base for any decision making
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ESD LCD SURFACE RESISTIVITY METER (WITH 1 PAIR OF 5 POUND ELECTRODES)
The ESD LCD SURFACE RESISTIVITY METER provides everything necessary to test work surfaces using the procedure outlined in the EOS/ESD-S4.1 standard. This test kit makes testing surface resistance easy – simply place the weights attach the cables, switch to the correct voltage and press the button to read resistance directly on the meter. The meter incorporates parallel probes on the bottom of the unit which allows the user to make surface resistivity measurements. The parallel probes allow for quick and easy testing of a variety of surfaces and materials, without the use of the five pound electrodes
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Load Cell & Microvolt Meter
A high-sensitivity 5-digit meter for use with load cells, strain gauges and microvolt input signals where high accuracy and stability are required. Load cell operation allows 4- or 6-wire hookup and display in engineering units, such as lbs, kg or psi. Built-in excitation for up to four 350-ohm load cells in parallel.
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4000W to 50,000W - Single Output
ALE-Rack Mount Series
*Compact, lightweight design*Simple parallel operation for higher power*Worldwide input voltages/frequencies*Fully adjustable output voltage*Full remote control interface*Safety agency approvals
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PXI Digital Test Instrument
PXIe-6943
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.This instrument is TPS-compatible with the legacy VXI digital test instrument from Astronics as well as other instrument vendors.
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Motor/Gasoline Engine RPM Detector
OM-1500/1200
The OM-1500/1200 motor/gasoline engine RPM detector is designed for rotation measurement of a gasoline engine and an EV/HEV motor. It detects magnetic flux leakage from the motor itself or the engine’s ignition coil.This easy to use and durable detector can measure engine rotation by attaching in parallel with the ignition coil. When the EV/HEV motor rotation is measured, attach the OM-1500/1200 perpendicular to the motor rotating shaft.It is used with the engine tachometer by Ono Sokki (GE-2500, AR-7240B, CT-6520B, HT-6200, SE-1620, FT-2500, FT-7200).
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96/48-CH Opto-22 Compatible PCI Express Digital I/O Cards
PCIe-7248/7296
ADLINK"s PCIe-7248/7296 are high-density parallel digital I/O boards with 96/48 I/O channels. The header connectors are fully compatible with industry Opto-22 standard. Thus, PCIe-7248/7296 can utilize the Opto-22 external devices. The PCIe-7248/7296 devices emulate mode 0 of the industry standard 8255 programmable peripheral interface (PPI) chips. The PCIe-7248/7296 provides 4/2 PPI chips respectively. Each PPI offers three 8-bit ports: Port A, Port B and Port C. The Port C is divided into 2 nibble-wide (4-bit) ports. The PCIe-7248/7296 devices have programmable timer/counters. One 16-bit counter is available for event counting, while the other 32-bit timer is available for timed interrupt generation. The PCIe-7248/7296 devices provide multiple programmable interrupt sources from DIO channels, as well as the output of the timer.
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Sensing Resistors
Resistive Voltage Dividers
NGR Sensing Resistors are attached in parallel to the neutral grounding resistor. The sensing resistor allows a protective relay to detect a resistor failure in a continuous manner. Sensing Resistors are used in combination with neutral grounding resistor monitor relays. The relay measures neutral grounding resistance, neutral grounding resistor current and neutral to ground voltage. The relay continuously measures neutral grounding resistor ohmic value in an unfaulted system and it trips on if neutral grounding resistance varies from its calibrated value.
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Bench Power Supply, Adjustable, Fixed, 3 Output, 0 V, 32 V, 0 A, 3 A
72-8695A
*Bench top general DC power supply for laboratory use*Series or parallel operation*Master-slave tracking, constant voltage, constant current function*Auto switching between voltage and current operation*Synchronized 6 digits voltage and current display*Low noise*Current limitation*Mode selector switchNatural ventilation for cooling*12-month limited warranty *view Terms & Conditions for details
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Analog/Linear Tester
Amoeba 4200
4200 is capable of running multiple test sites independently with a parallel efficiency of up to 85% for quad-site and octal-site testing.It comes with test development and production software suite, which makes the transition from test development and bench characterization to production seamlessly.
