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Burn-In
The application of current, typically at high temperatures, over periods of time to detect infant mortality.
See Also: Burn-In Boards, High Power Burn-in, Burn-In Sockets, PCB Inspection
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High Voltage Isolation Switch Contact Pressure Tester
WA1401
Wuhan Sangao Electrical Test Installations Limit Co.
Isolation switch is the high voltage switch equipment, it was large and frequently use in power system . The outdoor isolating switch is the only completely exposed in the atmospheric environment electrical equipment, It is also a electrical equipment affected by climatic conditions influence the most direct and most serious. The operating conditions is relatively poor, It is easy to generate fault of mechanical or electrical. Especially the finger contact part is easy to be affected by rain, dust and harmful gas invasion, resulting in poor contact caused fever, provide the spring with contact pressure due to heating and annealing for reducing the pressure, so that more cause finger heat form vicious spiral eventually burn out finger accident. In maintenance often only pay attention to replace the obvious failure and fracture of spring, but spring to reduce the pressure can not judge and replacement, so again in the operation, each finger current distribution by the pressure difference, The greater the difference between the current distribution is not uniform, long-term operation will occur is bad and the overheating. Fever finger will be vicious spiral, a finger contact bad will spread over the entire bad contact. At the same time, there are a lot of isolating switch contact pressure can be adjusted, if in maintenance adjustment pressure is not enough or each finger to adjust the pressure difference will also appear afore-mentioned phenomena.
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Burn-In Test
C.C.P. Contact Probes Co., LTD.
Customized Burn-In Test Sockets for temperatures of up to 180°C.
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Wireless Digital Multimeter 4000 count / NCV / SPT / Anti Burn Protection and with Max./Min./Max.-Min. display
MS-W2044P2
This is a external wireless connectivity Digital Multimeter integrated with 4000 Count, True RMS auto and manual measurement.
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5 ½ Digits Dual-Display Digital Multimeters
SDM3055
The SIGLENT SDM3055-SC includes a multiplexer that provides multi-point measurement capabilities. The scanner features 12 multi-purpose + 4 current channels and supports the following measurement functions: DCV, ACV, DCI, ACI, 2WR, 4WR, CAP, FREQ, DIODE, CONT and TEMP (RTD and Thermocouple ). It provides a convenient and versatile solution for test applications that require multiple measurement points or signals and is an ideal tool for R&D burn-in and production testing.
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Photonics Test Solutions
Chroma offers precision instruments such as laser drivers, photodetector monitoring, and temperature controllers. These lab class instruments are often intefrated into production solutions for wafer probe test, burn-in and device or module characterization with inspection, metrology, robotics, Industry 4.0 and more.
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DC Power Supplies
LPS Series
The LPS series power supplies are designed for various applications in semiconductor equipment along with OEM and industrial applications. Available for use in constant current or constant voltage applications they are available in power levels from 1,000 to 13,500 Watts. Common applications include heater, filament and magnet supplies along with test and burn-in applications. All models can be paralleled for increased power and custom configurations are available.
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Wireless Digital Multimeter 6000 count / NCV / SPT / Anti Burn Protection and with free "K" type temperature sensor (-40°C ~ 250°C).
MS-W2036P2T
This is a Palm size, external wireless connectivity Digital Multimeter integrated with 6000 Count, True RMS auto and manual measurement.
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6 Chip Detection and Burn Channels
CD1
The CD1 provides 6 Chip Detect and Fuzz Burn interface(s). A Chip Detector (CD) is a magnetic-electrical device that provides a reliable method of detecting impending failure of bearings and gears.
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Head Mounted Temperature Transmitters
Datexel manufactures a large range of head mounted temperature transmitters. Field proven and high accuracy are the ingredients in the Datexel range of head mount temperature transmitters. Low cost, fully isolated, PC programmable, direct or inverse output, up scale or down scale burn out are just some of the features available on the Datexel range of head mounted temperature transmitters.
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Test House Services
Microtest provides complete test house services in a clear room equipped with the state of the art handler and wafer probing system using its own innovative ATE.The test house operates in hot, cold and room temperature for both production and characterization test.Innovative reliability system for Burn In and HTOL ServicesStatistical analysis is performed for digital and mixed-signal devices.Microtest Pacific Test house is located in Malacca (Malaysia).
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Burn-in and Stress Screening Chambers
KDR
Supervise the operation of your product, electronic device, circuit board, or medical device while they are stress screened, burned-in, or temperature cycled inside a Bemco Kardburn or Koldburn glass front chamber. With a huge amount of testing or storage space within instant reach, KD Chambers provide a compact and attractive alternative to a walk-in chamber.
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Medical Storage Chambers
KDM
The Bemco KDM is similar to the Bemco Koldburn KDR except it has a circular air flow conditioning system located on the chamber ceiling, and is optimized for shelf supported temperature cycling, burn-in, stress screening, and storage of valuable pharmaceutical products or medical devices.
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MFP-570 Main Fuel Pump
The MFP-570 provides main engine burn flow as well as servo flow and engine actuator flow. This two-stage “cartridge type” fuel pump is designed to be inserted directly into the engine fuel metering unit.
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Photodiode Burn-in Reliability Test System
58606
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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3U OpenVPX High Density Multifunction I/O Board
68CB6
The 68CB6 is a Configurable Open Systems Architecture™ (COSA®) 3U OpenVPX™ board that is preconfigured with 10 different “inboard” I/O, measurement and communication functions. This Combination-function Board (CB) provides a full suite of some of the most common & useful function interfaces supporting many different applications. The 68CB6 features a wide but dedicated selection of functions: Standard Functionality Discrete I/O (DT1); Successive Approximation Register (SAR) ±100 V Analog-to-Digital (AD); Isolated High Voltage Analog-to-Digital (ADF); ±10 V Digital-to-Analog (DA); Thermocouple (TC1) or Resistance Temperature Detector (RT1); Full-bridge Strain Gauge (SG1); Transmission/gear box Chip Detection and Fuzz Burn (CD1); LVDT-to-Digital linear (LD6) displacement (position) measurement, AC Reference Source output (AC2); CAN bus communication (CB8). The 68CB6 offers unparalleled programming flexibility, a wide range of operating characteristics, and a unique design that eliminates the need for external intermediate circuit considerations such as pull-up resistors or mechanical configuration jumpers. Inboard functions are software controlled and memory addressed, accessed in similar COSA® modular fashion to maintain seamless common NAI Software Support Kit & API/library structures.
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LGA Sockets
We’ve taken our QFN expertise and combined it with the versatility and performance of the H-Pin® to leverage an LGA socket platform that serves the demanding requirements of today’s market. Plastronics LGA sockets using the H-Pin provide a high-performance socket that is affordable for all burn-in operations. These LGA sockets meet the power, temperature and signal performance needs of the higher density, larger package outline, and sometimes mix-pitch LGA designs. The LGA platform serves package sizes from as small as 2.0mm X 2.0mm to the industry’s largest standard socket for 60.0mm X 60.0mm packages.
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Environmental Stress Screening
ESS
Environmental stress screening (ESS) is also known as Burn-in, AST (Accelerated Stress Testing), HALT (Highly Accelerated Stress Test), or HASS (Highly Accelerated Stress Screening). Whatever the name, the idea is the same: create a test program that allows you to eliminate the infant mortality of your product.
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Low Voltage Burn-in and Test System
Max 450
For burning-in and testing DUTs such as microprocessors, DSPs and logic devices, which require low voltage. Output monitoring gives functional test results for every device during burn-in
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Diode Scanner
SC924
Frothingham Electronics Corporation
The SC924 is an electromechanical device for testing diodes loaded on burn-in boards.A set of Kelvin contacts is indexed from diode to diode. The contacts move over a range of 24 inches in the X direction and the table holding the boards moves over a range of 9 inches. This allows scanning of multiple burn-in boards or boards with multiple rows of diodes.
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RF Burn-In Services
Innovative Circuits Engineering, inc
There are many burn-in services that we offer such as HTOL, RFBL, ELFR, LTOL, etc and our focus on quality and customer service when providing burn-in custom solutions is second to none. We work closely with our customers to make sure we provide them with the best possible burn-in regardless of their lot size or pin count. We can also provide you with other electrical stress tests such as THB and HAST, and we can provide you with comprehensive status reports for your tests as they progress whether they be burn-in, THB, HAST or any other test.
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Industrial Automation Solutions
LXinstruments FCT systems for industrial electronics assemblies are particularly suited for applications with a large variant diversity for medium volume sizes. They are used for testing utility electronics as well as for drive control and grid management systems. We have also implemented systems for functional test, repair and calibration of decentralized PLC I/O assemblies.Since early failures in the field often lead to enormous costs, we not only provide functional test systems, but also burn-in systems for simultaneous testing of many assemblies in a climate chamber. Due to the modular structure of our software, it is possible to establish a logical separation between the definition of the climatic profile to be executed and the actual test sequence, during which the different electrical tests are processed. Connections to HALT/HASS systems can also be established without problems.
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Vertical Flammability Chamber
TESTEX Testing Equipment Systems Ltd.
Vertical Flammability Chamber for measuring the vertical flame spread of children’s sleepwear, fabrics (fabric burn test), other textile materials or resilient filling materials used in upholstered furniture. Vertical Flammability Chamber complies with ASTM D6413, CALIF TB117, 16CFR Parts1615/1616, etc. Please contact us for more information about flammability test method.
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Burn-in and Test Sockets
Loranger International Corporation
Loranger International Corporation designs and manufactures thousands of socket styles for the burn-in and test of semiconductors and electronic components. Some of the socket styles are listed below.
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DC Electronic Loads
Electronic Test & Power Systems
An adjustable electronic load gives the test engineer the ability to qualify designs, check production batches or service and repair electrical products. Many applications demand an adjustable electronic load. These include the burn-in of new devices along with general power supply, battery, fuel cell and generator testing.
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AC & DC Loadbanks
Regular load bank testing of generators provides an essential health check service to prevent diesel engine failure due to wet stacking. Wet stacking occurs due to under loading of the genset which results in wet un-burned fuel building up in the engine. This fuel build up will over time line the combustion chamber cylinders and cause a reduction of the engines rating and efficiency which will ultimately cause premature failure of the generator. Running the generator on load of 50% - 100% of the genset rating will allow the engine to reach the recommend operating temperature, which will burn off the choke deposits.
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Compact Cable Test Van
ETL-15
ETL-15 is compact enough to be mounted even in a minivan, yet contains all the equipment typically found in a fully-featured cable test and fault location system, including burn module, surge wave generator, time-domain reflectometer and high-voltage DC test module.
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TEST SOCKET
IC Package It is a device to install INTERFACE between TESTER and DEVICE during TEST to check electrical defects such as O / S (Open, Short) test, mounting test, BURN-IN TEST and RLC TEST, The device
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Multi-Wafer Test & Burn-in System
FOX-XP
The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
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LED Burn-In Test
Burn-in system, based on LXI instrumentation, for concurrent testing of up to 80 DUTs in a climatic chamber. Devices to be tested include modern light emitting diodes and LED modules.The system consists of 2 control cabinets, each with 40 independent supply and measurement channels. Each channel can be configured individually via the operator software (current or voltage, including the relevant limit values). The software supports logging of current and voltage values for each DUT on all 80 channels with a sampling rate of <1s. Additionally, the software and system also support digital I/O channels, e. g. for controlling the climatic chamber. Inputs for connecting temperature sensors are also provided.
