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Clock & Data Recovery
Macom Technology Solutions Holdings Inc.
Macom offers a series of high-performance, flexible, clock-and-data recovery (CDR) devices to remove the jitter from signals in high data rate systems. Our family of CDRs spans from 10Gbps to 100Gbps per lane in multitude of configurations including single lane and multi-lane devices, standalone CDRs and integrated combo devices with TIA and laser drivers. This wide portfolio of configurations offers customers design flexibility and cost-optimization in systems for Ethernet and OTN based network infrastructure markets and extending to high performance computing, storage-area-networking (SAN), industrial and aerospace applications.
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Electrical Clock Recovery
N1076B
The N1076B Electrical Clock Recovery provides standards-compliant clock recovery capability on electrical NRZ and PAM4 signals from 125 MBd up to 64 GBd
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Optical/Electrical Clock Recovery
N1077A
50 MBaud to 32 GBaud data rate range (continuous) on optical and electrical designs Provides standards-compliant clock recovery (CR) for NRZ and PAM-4 data signals Yields flexible, compact, high-sensitivity CR design with an integrated amplified optical-to-electrical (O/E) converter Gain optimal ease-of-use with integrated splitter and bulk optics coupler (Option SMS)
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Optical/Electrical Clock Recovery
N1077B
N1077B Optical/Electrical Clock Recovery provides standards-compliant clock recovery capabilities for multimode and single-mode optical as well as electrical signals from 125 MBd up to 64 GBd PAM4 and NRZ
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Electrical And Optical Clock Recovery
Series Oscilloscopes
Provide clock recovery capabilities for optical and electrical NRZ and PAM-4 signals up to 64 GBaud with jitter spectrum analysis (JSA) and integrated variable equalizers advanced features
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Optical / Electrical Clock Recovery
N1078A
N1078A Optical/Electrical Clock Recovery provides standards-compliant clock recovery capabilities for single-mode optical as well as electrical signals from 125 MBd up to 64 GBd PAM4 and NRZ
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8 Series Optical Clock Recovery
The 8 Series Optical Clock Recovery is a fast, flexible and reliable instrument for assisting in the validation of current and future optical designs. With all the applicable standard rates in the 26 and 53 GBd data rate ranges – no options required – the TCR801 Optical Clock Recovery is a crucial component for any bench or rack aimed at verifying the latest high-speed optical standards. Featuring quick lock capabilities and a sensitive front end for low power signals, this instrument simplifies the challenges associated with today’s optical testing.
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Clock, Data, Trigger Recovery Products
Optellent offers a range of products to recover clock, data, and trigger signals from electrical and optical data signals to facilitate testing and eye-diagram / eye-mask analysis.
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Clock and Data Recovery/Retiming
Analog Devices provides single rate, multiple rate, and continuous tuning clock and data recovery (CDR) ICs for metro, long haul, DWDM, FSO, instrumentation, and other applications. Our any rate CDR ICs allow easy integration into protocol agnostic applications, automatically locking onto incoming data streams at any rate, from 10 Mbps to 2.7 Gbps or from 6.5 Mbps to 11.3 Gbps, without the aid of a reference clock while reporting the acquired data rate over the I2C interface. With a proprietary dual loop design, our any rate CDR ICs feature fast locking with superior jitter performance.
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28/45 GHz Dual Optical Channel DCA-M with Option CDR
N1092B
High accuracy, low cost solution for optical waveform analysis including solutions for 8.4 through 64 GBaud, very low noise and jitter, fast sampling rates for high throughput, and integrated clock recovery available.
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28/45 GHz Single Optical Channel DCA-M with Option CDR
N1092A
High accuracy, low cost solution for optical waveform analysis including solutions for 8.4 through 64 GBaud, very low noise and jitter, fast sampling rates for high throughput, and integrated clock recovery available.
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50/85 GHz Precision Waveform Analyzer
N1060A
Gain margin with high instrument performance: high BW (50 GHz or 35 GHz) receivers, ultra-low residual jitter (< 50 fs typical); adjustable clock recovery peaking & loop BW Reduce development time through instrument flexibility with integrated clock recovery (data rates 50 Mb/s to 32 Gb/s) & integrated pickoffs & phase matched cables for simple one connection "triggerless" operation Reduce validation time with analysis tools like Jitter Spectrum Analysis & SW Clock Recovery Emulation
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Advanced Measurement Package For M8000 Series Of BERT Test Solutions
M8070ADVB
The M8070B system software for the M8000 Series of BER Test Solutions can be enhanced by additional software packages, such as M8070ADVB or M8070EDAB to get the best out of the M8040A, M8020A and M8030A J-BERT platforms.The M8070ADVB Advanced Measurement package offers advanced features like automated jitter tolerance test and parameter sweeps, eye diagram measurement or the integration of external equipment such as electrical and optical clock recovery or error analysis using a real-time scope.
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Continuous Time Interval Analyzer - PXI
GT668PXI-40
A true breakthrough in high-speed Time Measurement and test technology, GuideTech’s GT668PXI-40 leverages the power of its CTIA continuous time-stamping technology, eliminating the need for supplemental triggers, pattern markers or clock recovery circuits.GuideTech’s CTIAs enables serial interfaces pattern verification and full jitter analysis in milliseconds for fast, automated characterization and high-throughput production test on all ATE platforms, including low-cost and in-house testers.GT668PXI-40 cards can be expanded up to 36 Channels Single Ended Input in a single 3U PXI chassis.
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Digital Thermometer
BT-2
● Measure and display the indoor/outdoor temperature and indoor humidity● Automatically memorize the Max./Min. values of the indoor/ outdoor temperature and indoor humidity●Switch between℃ / ℉● Clock function and alarming function●12/24 hour mode switch● 8 minutes snooze function● Recovery function on the Max./Min. valuesTechnical parameters:● Indoor temperature measuring range: -30℃～+50℃(-22℉～122℉)● Outdoor temperature measuring range: -50℃～+70℃(-58℉～158℉)● Indoor humidity measuring range: 20%～99% (Relative humidity)● Resolution: Temperature:0.1℃; Humidity: 1% RH● Power supply: one 7# alkaline battery● Operation environment: Temperature:0℃～50℃; Humidity: 5%～85% RH
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mAEStro Audio Digital to Analog Converter
The mAEStro ADAC-100 receives AES/EBU (AES3) or S/PDIF digital audio and converts it to two channels of analog audio. It automatically detects sample rates up to 96kHz with low-jitter clock recovery. Two balanced line-level audio outputs are provided on XLR connectors on the rear panel. For convenient monitoring, a stereo headphone mini-jack and volume control are provided on the front panel.
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mAEStro Digital Audio Re-Clocking Distribution Amplifier
The mAEStro ADA-100 receives AES/EBU (AES3) or S/PDIF digital audio and provides four re-clocked digital audio outputs. It automatically detects sample rates from 32kHz to 96kHz with low-jitter clock recovery. The outputs are completely regenerated using a jitter-free clock that is locked to the source input. The rugged self-contained metal enclosure has a number of mounting options from desktop, to rear side-rail rack mounting, to ganged front-side or rear-side rack mounting.
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Process Recovery
Let us help you recover bracketed product. Whether it is finding contaminants, removing contaminants, repackaging, relabeling, stamping, or some other activity that needs to take place so you don’t have to dispose of product and start from scratch, FlexXray can save you time and money.
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Recovery Tools
PCAID III
Write protection function to protect important data is installed. Data can be protected from erroneous writing.High speed transfer thanks to USB 3.0 connection.Easy HDD attaching and removal thanks to one-touch docking.Data can be backed up and restored from HDD connected to a PC by using software sold separately (Disklosure).Backup data of multiple computers can be stored in one PCAID III by using software sold separately (Disklosure).
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Clocks
Spaceborn applications demand increased bandwidth and performance in their electronic subsystems.
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Crease Recovery Tester
TF110A
TESTEX Testing Equipment Systems Ltd.
Crease Recovery Tester & Loading Device, to determine the recovery properties of fabrics by creasing in a loading device for a predetermined time using a weight suitable for the test method specified (BS/ISO/AATCC). After transferring the specimen to the clamp of the tester, the specimen is allowed to recover and the angle of recovery recorded.
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Crease Recovery Tester
TESTEX Testing Equipment Systems Ltd.
Crease Recovery Tester, to determining recovery properties of fabrics by creasing in a loading device for a predetermined time using a weight suitable for the test method specified (BS/ISO/AATCC), After transferring the specimen to the clamp of the tester, the specimen is allowed to recover and the angle of recovery recorded. Fabric Crease Tester complies with ISO 2313, AATCC 66, BS EN 22313， etc.
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Fast Recovery Diodes
We offer high-performance products with low forward voltage (VF) and high-speed reverse recovery time (trr) for increasing device efficiency.
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Step Recovery Diodes
Macom Technology Solutions Holdings Inc.
MACOM’s Silicon and GaAs varactor multiplier diodes provide broadband performance ranging from 10 MHz to 70 GHz. They are ideal for multiplier circuits and are available in die form, plastic and ceramic packaging. These diodes boast a flip chip series for higher frequency millimeter wave applications; plastic packaged series for microwave frequency surface mount applications; ceramic packaged series for high power waveguide and coaxial applications.
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Step Recovery Diodes
SemiGen’s SSR series of Step Recovery Diodes are epitaxial silicon varactors which provide high output power and efficiencies in harmonic generator applications. Using custom epitaxial wafers, our process ensures high reproducibility. The silicon dioxide passivation process assures greater stability and low leakage currents over temperature. Uniform capacitance ensures repeatability from device to device. These diodes are available in chip or packaged form.
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Wrinkle Recovery Tester
TF112 AATCC
TESTEX Testing Equipment Systems Ltd.
AATCC Wrinkle Recovery Tester is used for determining a fabric's ability to recoverafter wrinkling under a pre-determined load for a set period of time.Provided with a set of 5x3 dimensional plastic replicas to grade fabrics 1-5.
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Atomic Clocks
Society has become dependent on atomic time. Atomic clocks underpin our financial transactions, communications services and broadcast services, but they are expensive to produce and maintain.Quantum technology brings a new generation of clocks which are smaller, more accurate and cost effective, and as a result this is driving an evolution of new time-critical products and services.
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Clock And Timing
Achieving highly accurate precision timing is no easy feat from a technology perspective, so it’s important to find a resource you can trust to reduce design risk and speed your time to market. Our end-to-end timing solutions generate, distribute and apply precise time for multiple industries, including communications, aerospace and defense, IT infrastructure, financial services, power utilities and more. We provide a broad range of clock and timing solutions ranging from MEMS oscillators to active hydrogen masers. Explore our portfolio of clock and timing components and systems to find the right solution for your project.
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Clock Dividers
The Analog Devices clock divider portfolio features ultralow noise and low power consumption options to help meet your design needs.
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Clock Drivers
Multiple timing signals ("clocks") are required by CCDs, IR FPAs, and some CMOS image sensors to transport electrical charge across the array to a sense amplifier for conversion into image data. Pulse Instruments offers a line of "clock drivers" for generating these timing signals. The parameters of these clocks (clock rate, pulse width, pulse amplitude, rise- and fall-times, etc.) greatly influence the behavior and performance of the imaging device. Our products take logic-level inputs from a pattern generator and allow the user to adjust the output parameters to suit their device and testing requirements. Clocks can be "tweaked" in real-time to determine optimal operating parameters for a particular device, or else programmed in accordance with a test plan for automated production test.
