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Device Under Test
a specific purpose component or module check; ex. substantial component of a PCB.
See Also: DUT, Unit Under Test, EUT
- Pickering Interfaces Inc.
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PXI Automotive Switch Simulator Modules
Pickering's Switch Simulator Modules are designed for automotive test applications. These modules simulate the operation of automotive switches where dirty contacts or leaking current can be expected from switch contamination. They allow automotive I/O devices to be tested for correct operation under adverse conditions.
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Qualification Tester
LQ404
Computer Gesteuerte Systeme GmbH
The qualification tester LQ402 is designed to support up to 12 DUTs (Device under Test), for which the loads are installed in separate load boxes. The system consists out of 3 cabinets. One is for the electronic components with the primary measurement devices and the other two hold the 12 load boxes.
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HIGH FREQUENCY DC BIAS
6565 SERIES
The 6565 HF DC Bias Unit is intended to be used with a Wayne Kerr 6500 analyzer, either the 6500B Precision Impedance Analyzer or the 6500P HF LCR Meter. Its function is to provide a source of DC bias current through the Device Under Test (DUT) while the analyzer is making AC measurements. Each 6565 unit can provide up to 10 A of DC current, and up to six 6565 units can be connected in parallel to supply a maximum 60 A. A digital ammeter on the front panel allows the user to see the dc bias current value and an indicator LED shows when the bias current is enabled.
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PXI Switch Matrix Modules
From low density to high power - we have the PXI matrix switch modules you need. PXI matrix switch modules deliver low, medium and high-density switching of multiple channels in a single instance. They are organized in rows and columns to provide maximum flexibility, allowing you to connect any row to any column, making them ideal for routing multiple signals between your device under test and your instruments.
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DC Hipot Test Instrument
M100DC
Performs concurrent ground continuity test. ARC and OVERCURRENT detection circuits. Fast discharge of Device Under Test (DUT) and other test standards
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Striptest Contactors
ULTRA® CONTACT Series
ULTRA® CONTACT Series offers high yield, durability and consistent performance under the most demanding testing environment. Our design offers easy integration to most test handler platforms and on automotive devices.
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Artificial Power Supply Network
KH3760
Beijing KeHuan Century EMC Technology Co,.LTD
The artificial power supply network (also called the power supply impedance stabilization network) should be able to provide a stable impedance to the device under test in the radio frequency range, isolate the device under test from high-frequency interference on the power grid, and then couple the interference voltage to the receiver.
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6kV, 100 MHz High Voltage Differential Probe with Auto Zero Disconnect
HVD3605A
The HVD3000A series of high voltage differential probes cover the fullest range of applications, from 120/240 V switch-mode power supplies through 600 V class and 5 kV electrical apparatus. The table below provides a list of recommended probe models based on specific device under test applications.
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RF Shielded Box
TS7124
R&S®TS7124 RF shielded boxes enable reliable and reproducible measurements in shielded test environments. The R&S®TS7124 shielded box provides high shielding effectiveness, a good antenna coupling factor and a rugged mechanical design for reproducible results. RF test boxes have been designed not only for product designers or product optimization but also for production lines of wireless devices under test. The soft close feature makes the shielded box safer to operate.
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JTAG Functional Test
JFT
JFT comprises a series of software modules that support boundary-scan test and programming activities under Python, National Instruments LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan test application scripts, VIs or programs for PCB assemblies and systems that control individual driver/sensor pins, groups of pins declared as variables or register bits. These applications are typically used to test logic devices or mixed signal clusters and can also be transformed into re-usable test 'modules'. Pairing JFT with JTAG CoreCommander emulative test modules gives an effective, low-cost system for performing tests through embedded device peripherals (ADCs, Memory Controllers etc..)
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Pneumatic Test Pump Kit
700HPPK
The Fluke Calibration 700HPPK Pneumatic Test Pump Kit generates and adjusts pneumatic pressures up to 21 MPa (3000 psi), without requiring a nitrogen bottle or other external pressure supply. It supplies pressure to devices under test (DUTs) that include transmitters, controllers, pilots, digital and analog gauges, and more. It’s the perfect solution for generating high pressure in the field, where conditions and operating surfaces can vary. The 700HPPK is the ideal choice for calibration technicians, test engineers, and instrument technicians working in industries like natural gas transmission and distribution, process, aerospace and defense, who need a simple-to-use, safe and portable pressure source that they can depend on in a wide variety of conditions.
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PXI Battery Simulator Module
41-751-001
The 41-751 is a low power battery simulator module that can be used to simulate the power supplies of cellular phones and other portable battery devices. It features fully floating output terminals than can deliver voltages up to 6 Volts. The fast responding remote sense connections allow the module to regulate the supply voltage at the device under test.
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Regenerative AC Load
61800
Chroma Power Electronics Test Solutions not only apply in the industries of Information Technology, Communication, Aerospace and National Defense, but also in energy efficient products such as Hybrid Automobiles, LED luminance devices, solar and fuel cells that are developed aggressively under the pressure of natural resource constraints. Chroma has a wide variety of instrumentation including AC Power Sources, DC Power Supplies, DC Electronic Loads, AC Electronic Loads, Digital Power Meters, and Automatic Test Systems that are ideal for power input/output terminal tests and dynamic simulation.
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1149.6 Boundary Scan Feature, GTE 10.00p
K8213A
Keysight’s Interconnect Plus Boundary Scan 1149.6 feature enables all the tools required to develop and execute this test method on the board under test. Compared to the 1149.1 standards, the 1149.6 standards define test methods for the boundary scan devices that are designed with AC coupled signals or differential nets needed for high-speed operations of the device.
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Functional Test
xUTS
Extend test to encompass copious test points and DUT varieties along with real-time, hardware-in-the-loop and other state-of-the-art instrumentation. extendedUTS (xUTS) is a custom product for high complexity functional test. Configured for the unique needs of a class of devices under test (DUTs), the xUTS employs our universal test system approach that combines the best open platform instrumentation and software along with mass interconnect technology.
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Frequency Response Analyzer
A frequency response analyzer measures the gain and phase response characteristics with respect to frequency of the device or system under test, by applying a frequency swept sine wave to it and examining its response signal.Featured wide dynamic range realizes high precise measurement, and also ultra low frequency measurement.
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External Frontend
FE44S
The R&S®FE44S external frontend can extend the frequency range up to 44 GHz for Rohde&Schwarz signal and spectrum analyzers as well as signal generators. The R&S®FE44S enables signal up and downconversion directly at the device under test (DUT), lowering cable losses, increasing sensitivity and delivering more power at the antenna in an OTA environment. The R&S®FE44S uses a single RF connector to further reduce the number of antennas in over the air testing.
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PXI-4130, ±20 V, ±2 A DC, 40 W PXI Source Measure Unit
779647-31
±20 V, ±2 A DC, 40 W PXI Source Measure Unit - The PXI‑4130 is a programmable source measure unit (SMU). It has a single isolated SMU channel that offers a four-quadrant output that incorporates remote (4‑wire) sense. With its five current ranges, it is ideal for transistor characterization that requires accurately sourcing a constant current or voltage while sweeping another current. The PXI‑4130 also includes a utility channel that can source either current or voltage. This PXI SMU can act as either a constant voltage source or a constant current source, with a settable compliance limit for either mode. In addition, you can enable remote sense on the SMU channel to maximize voltage output and measurement accuracy on your device under test (DUT) for high-precision applications.
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Keysight Dual 4x16 Armature Matrix for 34980A
34932A
The Keysight 34932A module for the 34980A Multifunction Switch/Measure Unit gives you the most flexible connection path between your device under test and your test equipment, allowing different instruments to be connected to multiple points on your device under test at the same time. Dual 4x16, 8x16, or 4x32 configurations 128 2-wire cross-points 300 V, 1 A switch; 2 A carry current Connections to the internal DMM Latching armature relays, with relay counter Expandable via four 2-wire analog buses
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JTAG 3rd Party Controller Support
Corelis offers support for a variety of devices and instruments from third-parties in an effort to provide existing test platforms comprehensive JTAG test execution with Corelis ScanExpress software products. Supported instruments include National Instruments PXI-655x HSDIO and Teradyne Di-Series modules. Corelis also provides support for JTAG testing with FTDI FT2232 ICs embedded on a unit under test (UUT).
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JTAG/Background Debug Mode Test System PXI Card
NX5300
The NX5300 is a single slot 3U PXI device and interfaces to the unit under test via an On-Chip Debug (OCD) or JTAG port. The NX5300 is a high performance JTAG based background debug mode (BDM) diagnostic system designed for functional test, development, programming and troubleshooting of microprocessor and microcontroller based embedded processor systems.
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2-Axis Rate and Position Tables
When a device under test needs to be stimulated with simultaneous movements around two axes, then a product from the ACUTRONIC two-axis motion simulator range is the right choice. Due to their independent motion simulation in two axes they are very versatile: they are used as Inertial Guidance Test Systems (IGTS), for HardWare-In-the-Loop (HWIL) testing, for the test of optronic pointing devices, and many more applications.
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BERT Measurement Solutions
Bit error rate testers (BERTs) are usually the initial step for communications testing. These instruments generate digital test patterns, typically pseudorandom binary sequences (PRBSs), that drive devices under test (DUTs). Following the transmission of the signal through the link, the receiver in the BERT captures the signal. This setup can be used for multiple testing purposes, such as to evaluate the performance of a transmitter, a receiver, or an optical link.
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PXI Battery Simulator Module
41-750-001
The 41-750 is a battery simulator module that can be used to simulate the power supplies of cellular phones and other portable battery devices. It features fully floating output terminals than can deliver voltages up to 6 Volts. The fast responding remote sense connections allow the module to regulate the supply voltage at the device under test.
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Mass Interconnect
Mass Interconnect is a mechanical interface that simplifies connection between the power supplies, instruments and switching to the Device Under Test (DUT) in a test environment. In the illustration here, a test receiver is connected to the front of the modular instrumentation, in this case, a PXI chassis.
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PXI Matrix Switch: 8x32, 1-Wire, 100Vrms/2A, Armature Relays
M9122A
The M9122A is an 8x32 full crosspoint switch matrix offering high-voltage switching in a high-density PXI module. This module allows for higher voltage switching of multiple channels in a single instance. Any row can be connected to any column, making it ideal for routing instrument signals to the device under test. This module is configured with a common ground. The durable armature switches are capable of switching up to 100Vrms, with up to 60W of power. The 8-wide bus can be used to route signals between your instruments and the device under test. Choose from the durable connector block or standard cable connections.
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Modular Power
RFP DC High Power
AMETEK Programmable Power, Inc.
ReFlex Power™ is a high density, modular programmable power system providing DC, AC and electronic load assets all under control of a single controller. It provides a reconfigurable, flexible platform ideal for ATE and production test environments where RFP™ can provide programmable stimulus and bias power as well as programmable loads for the device(s) under test. The EIA 4U high RFP™ mainframe can hold up to 12 single-slot modules or combinations of single, dual and triple slot wide modules to configure (or reconfigure) the system for the particular requirements at hand. The mainframe can support up to 6 kW of output power.
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Keysight Dual 4x8 Armature Matrix for 34980A
34931A
The Keysight 34931A module for the 34980A Multifunction Switch/Measure Unit gives you the most flexible connection path between your device under test and your test equipment, allowing different instruments to be connected to multiple points on your device under test at the same time. Dual 4x8, 8x8, or 4x16 configurations 64 2-wire cross-points Connections to the internal DMM Expandable via four 2-wire analog buses Relay counter Latching armature relays 300 V, 1 A switch; 2 A carry current
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Semiconductor Test System
IST Information Scan Technology, Inc.
As power modules age, their performance degrades. Proper testing and maintenance of semiconductor devices used in power switching can ensure optimal performance and prevent down-time throughout a device’s lifecycle. The IST Model 8900 Series Discrete Semiconductor Test Systems allows you to effectively identify the percent of degradation in semiconductor devices by simulating the exact current and voltage of the parameters used by devices under real operating conditions.
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Pulsed IV-Curve Solutions
Pulsed IV-Curve Test and Analysis System is our new development for 2015. It is an advanced and compact pulsed IV-curve characterization system designed to simulate pulsed ESD events such as TLP, vf-TLP, HMM, HBM, EFT, and LV-Surge. It will monitor the transient voltage and current waveform during the pulse in ps or ns segment, and test the pre- and post-pulse status (leakage current, breakdown voltage, biasing current, static IV curve, etc) of the device under test (DUT), such as protection devices, semiconductors, circuit modules, touch panel sensor, etc.
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Optical signal transmission
Digital
The fibre optic cable are used to transmit digital signals from the device under test under EFT/burst interference.
