Filter Results By:
Products
Applications
Manufacturers
- Pickering Interfaces Inc.
product
Diagnostic Test Tools For Switching Systems
You know that verification and diagnosis of complex switching operation in a test system has always been an issue. Two of our latest offerings in diagnostic test tools provide a quick and simple way of finding relay failures within LXI, PCI and PXI switch systems.
-
product
ESD Test Simulator
ONYX16
The ONYX is a state of the art electrostatic discharge simulator available in 16kV or 30kV versions. It is the most ergonomic 30kV ESD gun without an additional base control unit that can be battery or mains operated. The easy to use touch screen, ergonomic design, modular RC units, multilingual interface, remote control software, built-in LED light and temperature & humidity display allows for trouble-free use of the ONYX in all types of test sites.
-
product
Surface Resistance System Kit
PRS-801RM
- Perform Point-to-Point and Resistance to Ground Measurements from 0.01 Ω to 200 Teraohms- Accuracy of ±2% from 1.00 Ω to 9.99x1010Ω- Measures in accordance with ESD TR53, ANSI/ESD S4.1, ANSI/ESD S7.1, ANSI/ESD STM97.1 and others- Constant Test voltages 10V and 100V meeting ANSI/ESD S20.20- Operates using a Rechargeable Li-ion Battery Pack- Takes Approximately 8,000 Measurements on a Single Charge (480 hours typical)- Stores up to 999 Test Values Into Memory- Compatible with Prostat Connect 2.0 for Downloading into Excel®- Charging and Download via Standard Micro USB Cable- Includes 5lb Conductive Probes and Carrying Case- Certificate of Calibration Traceable to NIST included- 2-year Limited Warranty on Main Instrument
-
product
ESD LCD SURFACE RESISTIVITY METER (WITH 1 PAIR OF 5 POUND ELECTRODES)
The ESD LCD SURFACE RESISTIVITY METER provides everything necessary to test work surfaces using the procedure outlined in the EOS/ESD-S4.1 standard. This test kit makes testing surface resistance easy – simply place the weights attach the cables, switch to the correct voltage and press the button to read resistance directly on the meter. The meter incorporates parallel probes on the bottom of the unit which allows the user to make surface resistivity measurements. The parallel probes allow for quick and easy testing of a variety of surfaces and materials, without the use of the five pound electrodes
-
product
1Gsps, 18 Channel, Logic Analyzer with Protocol Analyzer plugins and Hardware Compression
DigiView™ DV518
- Physical Channels: 18- Sample rate: 4ch@1 Gsps or 9ch@500Msps or 18ch@1Gsps (4 ch. are sampled every 1ns or 9 ch. are sampled every 2ns or 18 ch. are sammpled every 4ns)- Typical capture: 100M transitions (> 1B samples)- Hardware based triggers with 8 universal match circuits, and partitionable 16 stage sequencer- Adjustable Threshold (± 4V)- Real-time, Hardware-based, Adaptive Compression- Channels protected to ± 20V- Ground leads protected to ± 12V- High-quality test leads: 66 strand soft copper wires, flexible insulation, and gold plated connectors. Fit .025 square posts as well as the included clips.- Extra ESD protection- Streaming storage with auto fall-back to Store & Forward mode ensures large storage and reliability.- USB 3.0 (SS) or USB 2.0 (High Speed)- USB powered- Each DigiVIew includes all avialable Protocol Analyzer plugins (including: I2C, SPI, CAN, Async, Sync, 1-wire, I2S, TDM)- Free Plugin Developers' Kit- Requires Windows 7 or greater OS (32bit or 64bit)- Free Lifetime sofware updates.- 1 year warranty
-
product
PRODUCTS TESTING
ESD
MicroStat Laboratories -R.E.T.S.
Our ESD test capabilities include resistance, resistivity, electrostatic shielding, charge generation, and charge dissipation. We routinely test flooring materials, packaging, footwear, garments, ionizers and many other ESD control products and materials. We utilize the relevant test methods and standards of the ESD Association, ANSI, ASTM, NFPA, IEST, IEC, AATCC, or our clients’ in-house specifications.
-
product
Pulsed IV-Curve Solutions
Pulsed IV-Curve Test and Analysis System is our new development for 2015. It is an advanced and compact pulsed IV-curve characterization system designed to simulate pulsed ESD events such as TLP, vf-TLP, HMM, HBM, EFT, and LV-Surge. It will monitor the transient voltage and current waveform during the pulse in ps or ns segment, and test the pre- and post-pulse status (leakage current, breakdown voltage, biasing current, static IV curve, etc) of the device under test (DUT), such as protection devices, semiconductors, circuit modules, touch panel sensor, etc.
-
product
Microelectronics Test & Engineering Services
EAG's Microelectronics Test and Engineering lab network provides semiconductor and electronics design firms worldwide with test, debug, and early engineering support to help you with new product introduction. We actively service a broad range of semiconductor and electronics companies worldwide. Services include ATE testing, Reliability testing and qualification, ESD testing, Failure Analysis, FIB Circuit Edit and Debug. for both ICs and systems
-
product
Plant Auditor's Surface Resistance Kit
PMK-153
The PMK-153 Resistance Test Kit contains the instruments you need to take resistance measurements.The PMK-153 includes the PAS-853B Wide Range Ohmmeter with 5 pound Conductive Rubber Electrodes. The PAS-853B instrument is a wide range ohmmeter that measures accurately from 0.01 to 9.9x1012 ohms. In AUTO mode the instrument automatically adjusts resistance range and selects test voltage in accordance with standard practices outlined in ANSI/ESD STM11.11, and meets audit requirements of ESD TR53.
-
product
Ohm-Stat Deluxe Combo Data Logger Tester
ISO-9000 conformance: no more log booksResults automatically entered onto a computerAutomatically stores results for 50,000 employeesIncludes ESD protection test log software: free upgrades foreverCE mark, NIST listedTests heelgrounders and wriststraps in 3 sec individually and simultaneouslyBarcode, mag stripe, proximity meter availableResults can be emailed and/or networkedAdjustable limits9v battery or 110/220v powered
-
product
ESD Latch Up Tester
1100-ESD
Tokyo Electronics Trading Co., Ltd.
The Model 1100-ESD can easily and accurately perform ESD tests (HBM, MM) on ICs up to 64 pins. Also, all common pin combinations required by the standard can be realized.
-
product
Electrostatic Discharge
Our electrostatic discharge (ESD) measurement and control solutions include charge plate monitors, sensors, resistivity meters, and voltmeters. Reliably monitor, measure, locate, and test for static electricity.
-
product
ESD Test System
58154 Series
ESD (Electrostatic Discharge) Test Systems are PXI/PCI controlled module to simulate electrostatic discharge pulse during electronic device testing. The 58154 series offer both ESD STM5.1-2001-Human Body Model and ESD STM5.2-1999-Machine Model. The user friendly software offers programmable and flexible features, such as sampling test on a wafer, ESD model, ESD pulse polarity, ESD pulse interval in a sequence, and automatic testing function.
-
product
Automated DC Parametric Curve Tracer
MultiTrace
MultiTrace curve tracer is a mid-sized benchtop model supporting pin counts from 216-625 pins and includes the PGA-625 fixture as a standard interface. MultiTrace supports a wide range of test applications: Failure analysis, Reliability testing, Counterfeit device analysis, Nondestructive electrical counterfeit test, Opens, shorts leakage testing (OSL), Post decap electrical inspection, Optical fault localization, ESD testing, Latch-up testing, Supply current measurements, and more!
-
product
Immunity Development System
Used for EMI suppression in printed circuit boards during the development phase. The developer can use the E1 set to quickly identify the causes of burst and ESD interference. This allows the developer to design suitable measures to solve the causes of the interference. It can also be used to test the effectiveness of the measures taken.
-
product
ESD & Latch-Up Test Service
MASER Engineering has automatic test equipment for the most common ESD test pulse models. MIL - JEDEC - ESDA - IEC standards. IC level Human Body Model. IC level Machine Model. IC level Charged Device Model. System level IEC 61000 HBM. AEC-Q100 Field Induced Gate Leakage test. Static Latch-Up test. Dynamic Latch-Up test.
-
product
Decay Accessory Set
PGB-745
- Designed for measuring charge movement and decay time of ESD controlled materials- The set consists of two stainless steel electrodes and two very high resistance test leads selected for this application- The high resistance leads minimize leakage during the test cycle and are equipped with male banana plugs
-
product
Flying Probe Test
Producing the highest quality test programs since 2005, Test Coach is the proven specialist firm for flying probe test. Our in depth knowledge of SPEA systems and over 10 years of honed flying probe test techniques guarantees that our test programs offer the highest test coverage possible. As an In – Concert Partner with SPEA, we work closely with their team to keep at the forefront of new product innovations and technology, so that we can provide the latest advancements to our customers. In addition to test program development, we offer board test services, maintaining the systems and staff that allow for high throughput and the ability to consistently deliver the rapid turn times that customers can depend on. And, with 7,000 square feet of space, we feature a modern, clean, ESD safe and ITAR registered facility that surpasses expectations.
-
product
ESD Discharge Simulator
Model 9910 PurePulse/PinScan
Model 9910 PurePulse / PinScan is used to determine the ESD susceptibility level of electronic devices up to ±4kV. PurePulse generates ESD pulses up to 4kV for testing electronic devices for susceptibility to Electrostatic Discharge (ESD) using HBM, MM and HMM models. PinScan provides automatic sequencing of ESD testing of up to 128 pin devices, applying a discharge, thenperforming a curve-trace test to identify a failure.
-
product
Resistance Meter - Portable, Precision Resistance Measurement from 0.10 to 1.00 x 10^12 Ohms
PRS-812B
- Wide Range Resistance: 0.10 Ω to 1.00x1012 Ω- Accuracy of ±2% from 1.00 Ω to 9.99x1010Ω- Constant Test voltages 10V and 100V for specification measurements to meet international and domestic ESD measurement standards- Auto Resistance Range Control- Auto Test Voltage Control- Uses a Rechargeable Li-ion Battery Pack- Takes Approximately 8,000 Measurements on a Single Charge (480 hours typical)- 120 Data Set Internal Memory- Uses Standard USB Cable for Charging- Charges in 2 Hours- 2-year Limited Warranty on Main Instrument
-
product
Wafer/Chip/Package Semi-automated ESD Tester
400SW
Tokyo Electronics Trading Co., Ltd.
Semi-automated ESD tester featuring Ecdm 400E, Universal ESD Simulator. Used with a manual wafer probing system or a die manipulator, wafer or die level semi-auto ESD test can be done, as well as packaged device test. Damage is detected by V-I curve or leakage current change detection. Stress level and measurement points are programmed by personal computor via GP-IB. Once test terminals are selected, ESD endurance is automatically measured.
-
product
Wrist Strap Tester
Statclean Technology (S) Pte Ltd
ESD wrist strap is most commonly used protective devices which prevent the build-up of electrostatic charge on personnel. The random failure of wrist strap compromises the protection. Thus, it is important to test every wrist strap regularly.
-
product
ESD Wrist Strap & ESD Heel Strap (Footwear) combination Tester
ESD Wrist Strap and ESD Footwear being the front line defense against electrostatic build-up on the human body, must remain electrically perceptive for the user. Thus, it is very important to test every wrist strap and heel strap regularly. This combination Tester does the job efficiently without the hassle of juggling several gadgets.
-
product
LED Tester For Chip And Wafer
Electrical Testing: Forward：VF,DVF,VFDReverse：VZ,IROptical Testing: can test LOP in cd/mcd/W/mW/lm... from different optical componentsWavelength λp,λd,λc,hw,purity,(x,y),CCT,CRIFour-wire measurement and contact resistance in case of deviation.Auto polarity identification and preheat function.Compatible mechanical interface.Optional ESD static test system or polycrystalline test system
-
product
Impulse Semiconductor High Current Integrated
Transmission Line Pulse Test System
The Impulse Semiconductor High Current Transmission Line Pulse (TLP) test system is the tool of choice for extracting ESD parameters for transient protection devices in a package, or at wafer level. With accuracy better than 100 milliohms at 40 amps peak current, the Impulse high current TLP is specially tailored to the needs of today's ESD device designers who must accurately measure low values dynamic resistance irrespective of breakdown voltage.
-
product
ESD Tester
Tokyo Electronics Trading Co., Ltd.
Is performed to test the susceptibility of ICs and electronic devices to ESD.
-
product
Eurostat Turnstiles
For companies who need to ensure that the operators cannot enter the EPA unless their wrist straps and footwear are compliant every day• The turnstiles comply with ANSI/ESD S20/20 specification and ISO standards record keeping requirements • Both ESD safe shoes are tested separately through measuring electrodes, installed in the contact mat.• This system tests operators quickly (≤ 3 sec) and automatically and generate reports for the ESD coordinator• Communication with a server for traceability (Operator ID, Time & Date, Test values etc…)• LCD screen showing real time measurement• Keypad• Hygrometry measurement• Choice of measuring ranges and system calibration directly with the software• HID Wiegand interface, compatible to any HID card format
-
product
ESD Testing
MicroStat Laboratories -R.E.T.S.
A leading independent ESD test company, MicroStat Laboratories/River’s Edge Technical Service maintains a fully equipped ESD test laboratory committed to the testing and evaluation of products, materials, and processes used in electrostatic discharge (ESD) control.
-
product
Digital/Analog Audit Kit
Botron's Digital/Analog Audit Kit insulation and continuity tester is designed for electrical testing. The wide range of test voltages makes the Audit Kit ideal for users involved with ESD testing. The kit gives greater functionality with simplified operation and an ergonomically designed case.
-
product
Semiconductor & Electronic Systems Test and Diagnostics Services
Reliability Test and Diagnostic services are offered to a wide range of customers that are active as Fabless Semiconductor or Integrated Device Manufacturers, automotive electronics supplier, Telecom and ICT application specialists, Industrial and Medical electronic system manufacturers or in Aerospace and Space applications. Independent high tech test and diagnostic service laboratory. IC and electronic module qualification. ESD and Latch Up testing. Design assessment by HALT/HASS. Failure and construction analysis.
-
product
Transmission Line Pulse Testing
Transmission Line Pulse testing, or TLP testing, is a method for semiconductor characterization of Electrostatic Discharge (ESD) protection structures. In the Transmission Line Pulse test, high current pulses are applied to the pin under test (PUT) at successively higher levels through a coaxial cable of specified length. The applied pulses are of a current amplitude and duration representative of the Human Body Model (HBM) event (or a Charged Device Model – CDM – event in the case of Very Fast TLP, or VF-TLP).
