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- Artec 3D
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3D Scanner
Artec Eva Lite
Eva Lite is the budget version of the bestselling white light Artec Eva 3D scanner. It features the same accuracy specs, but with reduced functionality: Eva Lite has geometry only tracking and capture. As a result, this affordable 3D scanner can be used for making high quality textureless 3D scans when scanning geometrically rich objects, such as the human body.
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Beam Geometry & Alignment Testing
Perform quality control testing of your Digital Radiography (DR), Computed Radiography (CR) and Fluoroscopy X-ray systems with ease. Comply with local, state, federal, and governing bodies for digital and traditional analog radiographic imaging technologies.
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ReMesh
ReMesh is the CAD program, which provides powerful tools for geometry creating, checking and editing. Program has tools to remesh discretely or semi-analytically specified geometry in 3D and has convenient interface for editing geometry manually. Problems with remeshing of such geometries arise in EMC simulations.
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Thin Film Analyser
TFA
The TFA instrument has be designed to monitor dissolution rates with a minimal volume of developer, typically ≤ 1 ml. The design uses surface tension to hold the developer in a small gap between the sample and the detector head. The instrument allows multiple measurements on the same sample. Thickness measurement can be made in the same geometry as dissolution measurements.
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Benchtop Sphere (d/8°) Geometry Spectrophotometers
Hunter Associates Laboratory, Inc.
Diffuse d/8° benchtop sphere spectrophotometers are recommended for transmittance color and haze measurements of transparent liquid and solid samples, and color measurements of opaque samples where it is desired to negate the effects of sample gloss and texture, as is necessary in the color formulation process when determining the effect of pigment variations irrespective of surface characteristics.
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PV-IV Solutions
We offer a broad range of PV IV Measurement systems for measuring solar cells from 3 mm to 300 x 300 mm. The wide range of solar simulators, vacuum chuck test stations, and electronic loads make it impossible to list “standard solutions” Most systems are put together for individual customer needs based on cell type and contact geometry of the devices being tested. Over the last several years we have designed and manufactured a wide range test solutions for many different types of cells and contact geometries. In most cases a customized solution is no more than a slight customization of a standard platform that has been previously designed.
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1.0 mm Female to Circuit Card Launch, DC to 110 GHz
11923A
The Keysight 11923A 1.0 mm female connector launch is designed to thread into a package or fixture housing to transition a microwave circuit from microstrip to coaxial connector. The Keysight 11923A connector launch is intended for use with 110 GHz test systems such as the Keysight 8510XF. The Keysight 11923A comes pre-assembled, but the user is responsible for machining the package and installing the connector. The procedure describing the necessary geometry for the package and installation will be provided.
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Plastic Optical Fiber Preform Analyzer
2600
The unique vertical design of the 2600 Preform Analyzer gives manufacturers of GIPOF the ability to perform completely automated analysis. Its' automated axial (longitudinal) and radial preform positioning facilitates rapid and precise analysis of the entire preform structure. From the acquired index profile, the 2600 is able to calculate geometry metrics such as preform core diameter, outside diameter and core/clad concentricity.
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Disposable Spiral Mixers
Using simple, time-proven geometry, Nordson EFD’s patented disposable Spiral Mixers™ deliver complete and thorough mixing for a wide variety of two-part materials.
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Hybrid Photon Counting Detectors
MYTHEN2 Series
MYTHEN2 detectors guarantee noise-free performance, maximum resolution, and outstanding signal-to-noise ratios for an extended energy range from 4 to 40 keV. These systems include two module sizes: 1K with 1280 strips, and 1D with 640 strips. Their compact size, symmetrical sensor position, and DCS4 control unit make the MYTHEN2 series suitable for any diffractometer geometry — from portable instruments to large systems.
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Pruning Saw Control
Creation of a system that allows measuring the geometry of the board in the stream, determining the width of the wane, clean surface, the presence of large defects. Calculate the "net" width of the board and give signals for the movement of the saws to obtain the maximum output of the edged board of the given (standard) dimensions.
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Non-Destructive Subsurface Layer Profiling
NMR-Mouse one-sided NMR
The unique, powerful Profile NMR-MOUSE® probe works hand-in-hand with the Kea2 spectrometer. The Profile NMR-MOUSE is a portable, open NMR sensor equipped with a novel permanent magnet geometry that generates a flat sensitive volume parallel to the scanner surface. The system can measure *Proton density as a function of depth *T2 NMR relaxation times *T1 NMR relaxation times *Self-Diffusion coefficient of liquids
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UltraScan VIS Spectrophotometer
Hunter Associates Laboratory, Inc.
The UltraScan VIS easily measures both reflected and transmitted color as well as transmission haze and meets CIE, ASTM and USP guidelines for accurate color measurement. UltraScan VIS uses diffuse/8° geometry with automated specular component inclusion/exclusion. For transmission measurement, the use of a robust CIE-conforming sphere instrument (TTRAN Total Transmission mode) effectively negates the effects of minor scattering typically found in transparent samples.
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Camera Testing
FLIR
CI Systems' FLIR turn-key test stations carry out all the necessary tests to verify and compare the quality of an infrared/thermal camera. The FLIR test systems are based on CI Systems' NIST traceable blackbody radiation sources, collimators and special thermally controlled targets, designed to provide very accurate IR test patterns. All these combine to project standardized targets with known geometry and intensity to the Unit Under Test(UUT).
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3D Sensors (Main Screen)
surfaceCONTROL
surfaceCONTROL sensors are used for 3D measurements and surface inspections. The sensors use the fringe projection principle to detect diffuse reflecting surface and to generate a 3D point cloud. This point cloud is subsequently evaluated in order to recognize geometry, extremely small defects and discontinuities on the surface. Sensors with different measurement areas are available. This enables the inspection of the finest of structures on components as well as shape deviations on large-area attachments. Powerful software packages are available for evaluation and parameter setting.
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10 N Screw Flat Grips
10 N (2.2 lbf) screw flat grips are primarily used for tensile testing low force, soft materials such as yarn, paper, plastics, and cloth, in film or wire geometry. Grip faces are flat and rubber-coated, and the supplied coupling joints for the 10 N screw flat grips are designed for use on lower-capacity load cells.
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Rotman Lens Designer
Rotman Lens Designer (RLD) is a software tool for the design, synthesis, and analysis of Rotman Lenses and their variants. It is based on Geometrical Optics combined with the classical Rotman Lens design equations. It is intended for rapid development and analysis of Rotman Lenses given several physical and electrical input parameters. RLD generates the proper lens contours, transmission line geometry, absorptive port (dummy port) geometry, provides an approximate analysis of performance, and generates geometry files for import into Remcom's XFdtd® for further analysis and fabrication.
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Entry-level Price Interferometer for Geometry Measurement of Single Fibers
3D SCOPE-V2
Specifically designed for use in a production environment, 3D Scope-V2 is a robust, compact and easy to use interferometer that brings speed and precision to operators. 3D Scope-V2 supports our Blink software platform. Non-compressed, real time and high quality images are transfered from the hardware to the software via a USB 2.0 link in addition to the automation and control commands.
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3D Motion and Deformation Sensor
ARAMIS
ARAMIS is a non-contact and material-independent measuring system based on digital image correlation (DIC). It offers a stable solution for full-field and point-based analyses of test objects of just a few millimeters up to structural components of several meters in size. The system performs high-precision measurements with a 3D image resolution in the submicrometer range, regardless of the specimen’s geometry and temperature. There is no need for a time-consuming and expensive preparation. For statically or dynamically loaded specimens and components, ARAMIS provides accurate
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Multibeam Echosounder - Deep Water
SeaBat 7160
The SeaBat 7160 transducer array is comprised of linear receive and transmit arrays mounted together on a support base. The T-shaped array geometry provides the basis for a compact, high-resolution sonar which is easily installed for portable or hull mounts – a first for a high-resolution system in this frequency range. The system features a pitch-stabilized transmitter and an active roll compensated receiver.
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Substrate Manufacturing
KLA’s substrate manufacturing portfolio includes defect inspection and review, metrology and data management systems that help substrate manufacturers manage quality throughout the wafer fabrication process. Specialized wafer inspection and review tools assess wafer surface quality and detect, count and bin defects during production and as a critical part of outgoing wafer qualification. Wafer geometry systems ensure the wafer shape is extremely flat and uniform in thickness, with precisely controlled wafer shape topography. Data analysis and management systems proactively identify substrate fabrication process excursions that can lead to yield loss. KLA’s substrate manufacturing systems support process development, production monitoring and final quality check of a broad range of substrate types and sizes including silicon, prime silicon, SOI, sapphire, glass, GaAs, SiC, GaN, InP, GaSb, Ge, LiTaO3, LiNBO3, and epitaxial wafers.
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High Temperature Operating Life
7000 Series
With ever decreasing geometries, the way we perform HTOL requires careful consideration. In lower geometry device leakage currents are not only higher but vary greatly. Temperature control at DUT level – required to achieve correct junction temperature at every DUT. For higher geometries, HTOL can be performed in a more traditional way but with devices consuming more power, the ambient temperatures required varies greatly. Multiple temperature zones are required – multi zones system or multiple smaller HTOL systems.
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Interferometer
VFI-200
The FGC range is the complete solution for measuring the dimensions of standard and specialty fiber in both production and R&D environments. FGC-GS – fiber glass geometry for fibers up to 1000 µm diameter.
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AM Control System
Clamir
*Continuous monitoring of melt pool dynamics and geometry.*Ensures quality and repeatability.*Compatible with most laser heads.*Compatible with a wide range of materials.*Easy mechanical integration.*Quick configuration.*Helps to reduce CO2 emissions.
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ICP-MS spectrometers (ICP MASS)
SPECTRO Analytical Instruments GmbH
SPECTRO MS is a double-focusing sector field ICP MS (ICP mass spectrometer) based on a Mattauch-Herzog geometry with a newly developed ion optic and pioneering detector technology. It is the only ICP MS instrument available on the market today that is capable of simultaneously measuring the complete mass range used for inorganic mass spectrometry from 6Li to 238U with a permanent ion beam going to the detector.
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Portable Connector End Face Geometry Interferometer
Thorlabs’ Vytran® Connect-Chek® Interferometer automatically and precisely measures radius of curvature, apex offset of polish, and fiber undercut or protrusion on any PC or APC, single-fiber connector. The CC6000 interferometer uses a non-contact tilted-phase-analysis technique for fast, reliable measurements of connector end faces. This compact interferometer has a carrying handle and must be attached to a desktop or laptop computer (not included) with a standard USB 2.0 port for operation. The included CC6000 software, which is used to control the interferometer, can be installed on a computer with the minimum requirements in the table below. Designed for use in both the factory and the field, this interferometer provides crucial quality information needed to assure long-term performance of fiber optic connectors. One CC250P Mount for Ø2.50 mm PC Connectors and one RT250P Reference Tool for calibrating the CC250P mount are included with the CC6000 interferometer; mounts and reference tools that enable measurement of other PC or APC, single-fiber connectors are available separately below. When used with an appropriate mount for APC connectors, the CC6000 interferometer is also capable of measuring the APC angle and key error.
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Low Temperature Operating Life (LTOL) Test
LTOL
LTOL is being more used more and more frequently by manufacturers of low geometry devices as part of the qualification process, and in order to gain more failure data, a greater understanding of different failure modes of the device at low temperature, and to enable more complete reliability estimations. As device geometries decrease and frequencies become higher, Hot Carrier Injection (HCI) increases and the resulting degradation causes the deterioration of device characteristics and ultimately leads to failure.
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Optical CMM Systems
Our OmniLux metrology system is highly versatile and provides unparalleled levels of 3D CMM capture for component measurement in seconds. This high precision non contact, metrology system is extremely versatile because it measures components of any geometry and of any material. Geometries possible include: spheres, asphere, cylinder, internal bore, cone/taper, step height or freeform in any material such as polished or rough metals or ceramics and polymers. The Omnilux is fast and accurate because, unlike direct contact sensors, the use of optical sensors means that the whole surface can be analysed while the object is suspended in space, ensuring that no damage comes to delicate surfaces. Our easy-to-use software interface, developed from years of experience enables the operator to effortlessly control the system. Rich data analysis, automation and export of results for the immediate generation of reports as well as a compact footprint means OmniLux is the leading solution for production or R&D environments where reducing cycle times is critical to sustainable success.
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Hardware and Software Complex for Measuring Geometric Parameters
Vishera
Non-contact measurement of the geometry of objects using telecentric lenses Opto Engineering, illuminators of various modifications, 3D scanner Sick Ranger. The telecentric pair, in conjunction with modern digital cameras from Basler, ensures high accuracy in measuring the geometric parameters of objects, the principle of laser triangulation ensures high accuracy and scanning speed.
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Linear Strain Gauges
Linear Pattern Strain Gages are the most straightforward geometry of strain gauge, designed to indicate strain in only a single direction.
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High Power LED Test System
Lumere-GM
Evolusys Technologies Sdn. Bhd.
Lumere GM is a LED test and measurement system for various parameters of LED light. It is a high-accuracy system with a temperature-controlled CCD, its geometry conforms with CIE-Publication 127, and the test program is easy to configure and adjust. The Lumere GM is used in laboratory applications and in the production of high-power LEDs.