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- Artec 3D
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3D Scanner
Artec Space Spider
A new and enhanced precision instrument for CAD users and engineers, Artec Space Spider is a high-resolution 3D scanner based on blue light technology. It is perfect for capturing small objects or intricate details of large industrial objects in high resolution, with steadfast accuracy and brilliant color. The scanner’s ability to render complex geometry, sharp edges and thin ribs sets our technology apart. It is an ideal industrial 3D scanner for high resolution capturing of objects such as molding parts, PCBs, keys, coins or even a human ear, followed by the export of the final 3D model to CAD software.
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NTSC Standard Pattern Generator
PG315N
The MicroImage PG315 pattern generator is designed for simple size and geometry reference applications. The PG315 will overlay one of five standard patterns including a centered cross line, a centered cross hair, a centered target style symbol, a dot grid (cross dot) array, a hatch grid (crosshatch) array.
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Entry-level Price Interferometer for Geometry Measurement of Single Fibers
3D SCOPE-V2
Specifically designed for use in a production environment, 3D Scope-V2 is a robust, compact and easy to use interferometer that brings speed and precision to operators. 3D Scope-V2 supports our Blink software platform. Non-compressed, real time and high quality images are transfered from the hardware to the software via a USB 2.0 link in addition to the automation and control commands.
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WATOM
Wafer edge and notch profile measurementThe use of smaller and smaller patterns in the semiconductor industry calls for increasingly advanced materials of extremely high quality. In response to the steady improvements in the quality of wafers, KoCoS Automation has developed WATOM, a wafer edge and notch profile measurement tool which heralds a new era of extremely precise wafer geometry measurement.WATOM supports quality assurance throughout the wafer manufacturing process, starting at the very beginning and continuing on through to wafer reclaim.The WATOM Edge and Notch Wafer Geometry Analyser sets the worldwide benchmark for the quality assurance of geometrical measurements in semiconductor wafer manufacturing, combining the highest quality standards with top-class service. These high-precision, laser-based edge profile measurement tools are specially designed for optimum integration in manufacturing lines within the semiconductor industry.
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QW-Modeller For QuickWave
QW-Modeller for QuickWave is a workbench for the open source FreeCAD general purpose parametric 3D CAD modeller (http://www.freecadweb.org). FreeCAD features tools are similar to Catia®, SolidWorks®, or Solid Edge®. It is a feature-based parametric modeller with a modular software architecture, which makes it easy to provide additional functionalities without modifying the core system. The CAD capabilities of FreeCAD are based on the OpenCasCade® kernel, a professional-level CAD kernel, featuring advanced 3D geometry manipulation on complex shape types, a wide range of geometric entities, boolean operations and fillets, and built-in support of STEP and IGES formats.
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Colorimeter Measurement
DRK8620
Shandong Drick Instruments Co., Ltd.
WSC-S Colorimeter measurement is a superior performance, versatile and convenient operation colorimeter,suitable for the determination of various objects reflection color, whiteness test, chromaticity and color object with two objects. It is equipped with a geometry test head, that the provisions of CIE 0 / d. WSC-S Colorimeter measurement with two portable desktop, digital display, and available for print. The instrument can be widely used in textiles, dyes, printing and dyeing, paper, building materials, ceramics, food, printing, metrology and other departments.
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Non-Destructive Subsurface Layer Profiling
NMR-Mouse one-sided NMR
The unique, powerful Profile NMR-MOUSE® probe works hand-in-hand with the Kea2 spectrometer. The Profile NMR-MOUSE is a portable, open NMR sensor equipped with a novel permanent magnet geometry that generates a flat sensitive volume parallel to the scanner surface. The system can measure *Proton density as a function of depth *T2 NMR relaxation times *T1 NMR relaxation times *Self-Diffusion coefficient of liquids
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1.0 mm Female to Circuit Card Launch, DC to 110 GHz
11923A
The Keysight 11923A 1.0 mm female connector launch is designed to thread into a package or fixture housing to transition a microwave circuit from microstrip to coaxial connector. The Keysight 11923A connector launch is intended for use with 110 GHz test systems such as the Keysight 8510XF. The Keysight 11923A comes pre-assembled, but the user is responsible for machining the package and installing the connector. The procedure describing the necessary geometry for the package and installation will be provided.
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Agera Spectrophotometer
Hunter Associates Laboratory, Inc.
With its 0º/45ºc circumferential geometry, 60-degree gloss meter, UV-controllable LED illumination and 5-megapixel camera, Agera makes positioning samples and measuring color as simple as a snapshot. A single measurement captures and stores the image while it analyzes color, fluorescence, and gloss. Even large samples are no problem with the largest fixed-point contact area of measurement in the industry.
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High Temperature Operating Life
7000 Series
With ever decreasing geometries, the way we perform HTOL requires careful consideration. In lower geometry device leakage currents are not only higher but vary greatly. Temperature control at DUT level – required to achieve correct junction temperature at every DUT. For higher geometries, HTOL can be performed in a more traditional way but with devices consuming more power, the ambient temperatures required varies greatly. Multiple temperature zones are required – multi zones system or multiple smaller HTOL systems.
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Geometry
EDM Modal Geometry/ODS/Animation is the primary EDM Modal software module, and is required for every EDM Modal system. This option provides fast and efficient structural model generation and full 3D visualization of test and analysis results.
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AM Control System
Clamir
*Continuous monitoring of melt pool dynamics and geometry.*Ensures quality and repeatability.*Compatible with most laser heads.*Compatible with a wide range of materials.*Easy mechanical integration.*Quick configuration.*Helps to reduce CO2 emissions.
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10 N Screw Flat Grips
10 N (2.2 lbf) screw flat grips are primarily used for tensile testing low force, soft materials such as yarn, paper, plastics, and cloth, in film or wire geometry. Grip faces are flat and rubber-coated, and the supplied coupling joints for the 10 N screw flat grips are designed for use on lower-capacity load cells.
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SANA Mini Portable Interferometer
CA3005
CA3005 SANA mini is a portable, non contact fiber endface interferometer for single fiber connector. This interferometer has a high performance while the size of the instrument is incredible small. SANA mini need only a USB link to work without any external power supplies. It can test the geometry parameters of single fiber connectors such as radius of curvature, apex offset and fiber height. The data and report are generated in excel format and it is very helpful for management and analysis. SANA mini is a suitable interferometer for field usage.
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LED Test Production System
Lumere-LC
Evolusys Technologies Sdn. Bhd.
Lumere LC is a LED test and measurement system for various parameters of LED light. It is economical, its geometry conforms with CIE-Publication 127, and the test program is easy to configure and adjust. Main application is in the production of LEDs.
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Multibeam Echosounder - Deep Water
SeaBat 7160
The SeaBat 7160 transducer array is comprised of linear receive and transmit arrays mounted together on a support base. The T-shaped array geometry provides the basis for a compact, high-resolution sonar which is easily installed for portable or hull mounts – a first for a high-resolution system in this frequency range. The system features a pitch-stabilized transmitter and an active roll compensated receiver.
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Low Temperature Operating Life (LTOL) Test
LTOL
LTOL is being more used more and more frequently by manufacturers of low geometry devices as part of the qualification process, and in order to gain more failure data, a greater understanding of different failure modes of the device at low temperature, and to enable more complete reliability estimations. As device geometries decrease and frequencies become higher, Hot Carrier Injection (HCI) increases and the resulting degradation causes the deterioration of device characteristics and ultimately leads to failure.
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Hybrid Photon Counting Detectors
MYTHEN2 Series
MYTHEN2 detectors guarantee noise-free performance, maximum resolution, and outstanding signal-to-noise ratios for an extended energy range from 4 to 40 keV. These systems include two module sizes: 1K with 1280 strips, and 1D with 640 strips. Their compact size, symmetrical sensor position, and DCS4 control unit make the MYTHEN2 series suitable for any diffractometer geometry — from portable instruments to large systems.
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Human Radiation Spectrometers
Human radiation spectrometer is designed for express control and measurement of the activity of 137 Cs and 134 Cs gamma-emitting radionuclides in the human body, as well as for assessing the internal radiation dose (“sitting in a chair” geometry).
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Circular Helmholtz Coils
Helmholtz-Coils are especially designed to generate precisely defined magnetic fields from DC to the upper end of the audio frequency range and beyond. The generated fields are in a strongly linear relation to the coil current. The field- strength can be calculated exactly by analytical (or numerical) methods, based on the coils' geometry, the number of turns and the coil current.
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Interferometers
Sumix interferometers are designed for inspection of fiber optic ferrules, patch cords, pigtails and bare fiber in the process of polishing and assembly. They enable you to check polishing quality, test connector end face geometry per IEC, Telcordia or your own custom standards and generate reports to supply with your patch cords.
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Wafer Thickness, TTV, Bow and Warpage
ALTO-TTV FAMILY OFFERS THE SPEEDY MEASUREMENT OF WAFER GEOMETRY PARAMETER, MORE IMPORTANTLY, WE CAN AUTOMATE THE TOOL TO HANDLE FROM THIN WAFERS TO PERFORATED, WARPED, BUMPED, AND TAPE-FRAMED WAFERS. OPTIONAL SORTER AND SHIPPING JAR UNPACKING FUNCTION AVAILABLE.
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Digital Automated Interferometer and Microscope for Surface Inspection
DAISI-V3
The ultimate production interferometer for measuring end-face geometry on single-fiber connectors, equipped with a revolutionary «no-exterior-moving-parts» mechanical design.
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Wafer Sorter and Inspection
SolarWIS Platform
Eliminating the opportunity for problematic wafers to enter cell manufacturing lines greatly improves output and yield. ASM AE’s wafer sorter features 3D area inspection capability to inspect wafer thickness, total thickness variation (TTV), saw marks, as well as wafer bow and warpage. SolarWIS also includes modules that can inspect for stain, geometry, micro-cracks, edge chips, resistivity, P or N conductivity and lifetime.
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Software to Simulate Large Area Semiconductor Devices
Laoss
Laoss is a powerful software to simulate large area semiconductor devices (OLED, thin-film PV), taking into account the voltage drop in the electrodes due to important resistive effects when the size of the device increases.Simulation of large area semiconductor devices (OLED, thin-film PV)Coupling law input: analytical or tabulated (experimental or simulated) IV curveDevice optimization (electrode material, device geometry etc...)High speed computation
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Plastic Optical Fiber Preform Analyzer
2600
The unique vertical design of the 2600 Preform Analyzer gives manufacturers of GIPOF the ability to perform completely automated analysis. Its' automated axial (longitudinal) and radial preform positioning facilitates rapid and precise analysis of the entire preform structure. From the acquired index profile, the 2600 is able to calculate geometry metrics such as preform core diameter, outside diameter and core/clad concentricity.
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Camera Testing
FLIR
CI Systems' FLIR turn-key test stations carry out all the necessary tests to verify and compare the quality of an infrared/thermal camera. The FLIR test systems are based on CI Systems' NIST traceable blackbody radiation sources, collimators and special thermally controlled targets, designed to provide very accurate IR test patterns. All these combine to project standardized targets with known geometry and intensity to the Unit Under Test(UUT).
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Checking the Geometry and the Placement of the Weld
Based on the real geometric three-dimensional profile of the weld (groove) on the outside of a large diameter pipe, determine the offset of the center of the weld (groove) from the weld line. Provide continuous output of results through the RS-232 interface to the welding process control system. Provide a graphical picture of the current profile, the values of the specified and calculated geometric parameters to the operator.
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Wheel Running Tester up to 15000 kg axle load
MINC II EURO | VP 420005
Maschinenbau Haldenwang GmbH & Co. KG.
The test lane-compatible MINC II EURO guarantees a verification of the axle geometry in seconds when the test vehicle drives over (up to 15.0 t axle load) as well as a fully automatic evaluation of the deviation in m / km. The measured values are displayed either in analog form on a dial or by transmission to a PC screen (including graphic representation).
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Straightness Measurement Kit
55283A
The Keysight 55283A Straightness Measurement Kit, used with the Keysight 5530 Laser Calibration System, makes straightness, squareness and parallelism measurements to identify geometry errors that seriously degrade machine tool performance. These measurements allow documentation, analysis and diagnosis of machine tool travel and parallel axes of motion.
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TDR Structural Health Monitoring
Material Sensing & Instrumentation
MSI Time-Domain-Reflectometry (TDR) Structural-Health Monitoring probes the structural health of a composite part by propagating a fast electrical pulse along a distributed linear sensor which has been fabricated directly in the laminate. The sensor is formed from the native graphite fibers already used in composite manufacture, and constitutes zero defect. Fibers are patterned into a microwave waveguide geometry, or transmission line, and interrogated by a rapid pulse as shown below. Structural faults along the line cause distortions in waveguide geometry, producing reflected pulses similar to radar. Cracking, delamination, disbonds, moisture penetration, marcelling, and strain are all detected by propagation delay, for sensor lengths up to several meters.
