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ICT
Testing of short circuits, open circuits, component values and operation of ICs.
See Also: ICT Systems, In-Circuit Test
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TR5001 INLINE - ICT + FCT + MDA
*Optimized for inline integration, this SMEMA-compatible ICT is designed as an expandable platform for testing PCBAs
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Utility Card: Flash Programming Applications
This new feature enables the Keysight Medalist i3070 ICT to perform higher speed flash programming at the ICT station in the printed circuit board assembly manufacturing line. You can combine programming and testing into a single phase, to save time and money. This in-system programming (ISP) flash solution is tester-based and does not rely on fixtures, thus enabling greater flexibility and ease of debugging.
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Combinational Base Test Platform
6TL24
The 6TL24 is the Base platform ideal for Combinational test (ICT+FCT) in low to mid-volume, high-mix electronics productions. A dual-stage pushing mechanism will allow performing both, the FCT and the ICT test, without the need of changing the test platform and with a low cost fixturing technology. To do so, the exchangeable cassette fixture must be designed with two-level probes. IN the 6TL24, the second level is reached thanks to a pneumatic actuator.
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TestStation ICT
The TestStation is Teradyne’s flagship in-circuit test system optimized for complex, highly integrated boards and features award-winning SafeTest protection technologies. The TestStation has a test point range of 256 to 3,840 pins.
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Manual Test System for ICT & ISP with Integrated ABex and up to 426 Test Points
LEON Fixture
The LEONFixture is the ideal ICT and ISP solution for small and cost sensitive applications. This manually operated test system combines optimal ergonomics with high performance, durability and precision, ensuring your investment over the long term. The LEONFixture features a test system integrated in a manual base fixture. The system is designed to be used with an Ingun ATS MA13 insert which could be customized by a lot of fixture houses all over the world.As part of the LEON Family, LEONFixture is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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In-Line Full Automatic Testing System
ALMAX
Automated press unit with board loading belt.ALMAX can become automated in-line type in-circuit tester in case our ICT is integrated. And it also can become automated in-line function tester as well.PLC is not used in order to reduce cost as a PC control mechanical part.Press unit is 4 shaft structures which reduce unbalanced load and contact fail of probe pins.
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ABex Matrix Module with 86x4 or 43x8 Cross Points
ABex TM-404 Matrix
The ABex TM-404 is a 86×4 matrix designed as a universal connection between the test points and the measuring instrument. This can be done locally or via the ABex. The ABex TM-404 can be configured as a matrix with 4 or 8 busses. The internal matrix busses can be switched to the analog bus. The back connector allows to connect the TM-404 to the front of a Konrad PXI-501 ICT card to build a very compact ICT instrument. In addition, this combination can be used as an ABex system controller
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In‐Circuit Test Fixtures
Test Head Engineering designs and builds high‐quality In‐Circuit Test (ICT) Fixtures for HP / Agilent / KeySight Technologies 3070 board testers. We partner with In Circuit Test Engineering, Inc. to provide turn-key 3070 ICT solutions - both fixture and programming.
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ICT / FCT Probes
*Decades of experience*Proprietary base materials and coatings*Innovative designs*Optimized electrical path
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Flying Probe Tester
Condor MTS 505
Primarily the Flying Probe Tester was developed to enable In-Circuit testing (ICT) of prototype PCBs. For testing a new design an existing fixture has to be changed or a new fixture has to be procured. The fixtureless design of the MTS 505 Condor is one of its most attractive properties, where the unnecessary and costly time delays incurred for fixture build or changes can be avoided. It is the ideal platform for testing prototypes.
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Analog In-Circuit Tester
406C
The 406C is an open architecture power up test platform designed to facilitate the implementation of functional testing after the MDA test is completed. Internally dubbed as "Armadillo" the new architecture provides the user almost unlimited flexibility by combining the best of the VME buss and a dedicated ICT buss.
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ICT Probes
Merica Series-MPA75
Minimum Center: 1.91 (75mil)Current Rating: 3amps, continuousCurrent Resistance: 40milliohmsMounting Holes Size: 1.35Full Stroke: 6.35mmRated Stroke: 4.30mmSpring Force: 198gf(7oz)
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ICT/FCT-Fixtures, Max UUT 370 × 300 mm (wxd)
CK-2-228X (Small IF) / 230540
The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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Four Channel Relay Board for Power Supply Isolation
FXA-113 PSU Relay 4CH
The FXA-113 is a four-channel relay board designed as an output disconnect option for laboratory power supplies. Especially in ICT applications it’s important, that the power supply is completely isolated from the DUT during measurements. Therefor each channel features two high current relays for the power path and two reed relays for the sense path. All four channels are equipped with a status led and can be switched independently. In addition, it is delivered with an installed DIN rail carrier.
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6TL24 Combinational Base Test Platform
H71002400
The 6TL24 is the Base platform ideal for Combinational test (ICT+FCT) in low to mid volume, high-mix electronics productions. A dual-stage pushing mechanism will allow performing both, the FCT and the ICT test, without the need of changing the test platform and with a low cost fixturing technology. To do so, the exchangeable cassette fixture must be designed with two-level probes. IN the 6TL24, the second level is reached thanks to a pneumatic actuator.
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Spring Contact Probe
ICT
LEENO provides a variety of choices, offering over 1,000 standard ICT probe types. The ICT probes can be customized to deliver optimum solutions to customers.
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ICT Test Probes
C.C.P. Contact Probes Co., LTD.
Our In-Circuit Test Probes are used for all kinds of PCB tests. We offer a standard portfolio as well as customized parts.
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ICT/FCT-Fixtures, Max UUT 370 × 300 mm (wxd)
CK-2 Medium (Hold Down Gate) / 230156
The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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ICT/FCT-Fixtures (Large IF)
GenRad CK-2-228X
The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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In-Circuit Tester Integration
The benefits of boundary-scan are noticed in all phases of a product life cycle. By coupling the power of Corelis boundary-scan tools with an In-Circuit Tester (ICT), a complete, integrated solution is available that offers the best advantages of both technologies.Boundary-scan operates as the perfect companion to ICT. Boundary-scan is capable of testing areas of printed circuit board assemblies that are difficult to access due to physical space constraints and loss of physical access, which is often due to fine pitch components such as Ball Grid Array (BGA) devices. Conversely, the ICT is able to check the non-boundary-scan compatible portion of the unit under test (UUT) such as analog.
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ICT/FCT-Fixtures (Small IF)
GenRad CK-2-228X
The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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Combination Tester
Focus-4000
Programmable power supply（User can select big volume or high accuracy model）Fixed power supply (5V/12V/24V acceptable)High accuracy current measurement(MAX 2A) - FX710Voltage measurement MAX 16points(within +/-60V) - FX710Short relays 16pcs (MAX current 1A) - FX62024CH digital input output pins(8pcs per unit, IN/OUT setting) - FX700/FX71016 open corrector output for controlling external relays16 port (simultaneously 2 ports ) Oscilloscope channel for observing wave formCommunication function RS232C/GPIB（Standard）、CAN/LIN communication, Programmer(Options)Focus-2000Plus unique in-circuit Test（ICT）function
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Medalist i1000D Small Foot Print Inline and Offline In-Circuit Systems
U9405A
Unlike traditional bridge type board handlers that add a 3rd party equipment on your offline ICT systems, we provide a one-stop shopping experience when you are automating your in-circuit test.
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ICT - Flexible Multi-Core Parallel/Merged-Core Tester
TR5001 SII QDI SERIES
• Flexible Multi-Core Parallel / Merged-Core Tester• Serial Test Controller with up to 8 ports on any pin• Light - Curtain Protected Press - Down Platform• PXI Ready• Built-in Self Diagnostics and Auto-Calibration function• High-Accuracy Measurement• Flow - based Easy Program Development
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In-Line RF Test Station
AP770
ICT, Functional, Hipot, Vision, ISP and RF test with low cost fixtures in a very compact test station footprint Works with PCBs up to 450×550 mm or with palletized devices Space for up to 25 VPC mass interconnect modules or YAV switching units
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In-circuit Test
i3070
The Keysight i3070 In-Circuit Test (ICT) System embodies proven technology, enhancing test efficiency through time-tested software, hardware, and programmability. Catering to diverse PCBA sizes, it addresses applications such as IoT, 5G, automotive, and energy. Its unique design minimizes undesired effects from parasitic capacitance, enhances immunity to crosstalk, and eliminates stray signal coupling, ensuring consistent and repeatable measurements.
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4-Module ICT System, I307x Series 6
E9903G
Test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides those improvements built upon a proven technology foundation. With time-tested software, hardware, and programmability, the Series 6 are fully backward compatible with previous systems, and they make highly repeatable measurements.
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High Temperature Chip Resistors
ERJ-Hxx Series
Panasonic Industrial Devices Sales Company of America
Panasonic’s ERJ-Hxx Series Automotive Grade Thick Film Chip Resistors feature a maximum Category Temperature of 175°C and a maximum Rated Operating Temperature of 105°C. The ERJ-Hxx Series is AEC-Q200 compliant, ensuring strict quality control standards are in place to enforce optimal quality and reliability. The ERJ-Hxx Series Resistors offer a small size, higher power Resistor alternative that provides enhanced flexibility of PCB design by reducing solder-joint crack risk. This series is ideal for use in automotive, ICT, general industrial applications, and more.
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Design for Test
Test Coach offers Design for Test (DFT) consulting to assist customers with design review of prototype boards prior to release for production. Design for Test analysis is extremely important in ensuring that an assembly will achieve the highest possible test coverage. For ICT, this DFT will review the board to confirm that the bed-of-nails test fixture can be fabricated to test an assembly without sacrificing test coverage. As with ICT, Flying Probe benefits from DFT analysis by reviewing test point access and mechanical challenges that may affect the potential test coverage. Completing a DFT enables Test Coach to make recommendations to our customers that may be implemented on boards during the design phase which will allow for the most comprehensive coverage at time of test.
