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- Cirris Systems Corporation
product
High Voltage Tester
Easy Touch Pro
High voltage tester with built-in Windows operating system. The Easy Touch Pro is a self-contained high voltage cable tester designed for easy integration within your manufacturing process. Powered by a Windows and Cirris easy-wire software, this tester provides a good mix of function and flexibility. Up to 1024 points with add-on boxes (128 pts/box). Interchangeable adapters. IPC-WHMA A-620 Compliant. Meets requirements for classes 1, 2, and 3. 1500VDC 1000VAC
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Auditor Torque Cube
ATC Series
The Auditor Torque Cube (ATC) is a compact, versatile desktop tester and provides a multitude of capabilities. The ATC is designed to test hand or power tools with the following: Peak, first peak and track modes. Multiple engineering units. Manual and auto clear function. Multiple frequency response settings. Bi-directional use and accuracy. Accuracy is better than 1% of indicated reading top 90% of range. Serial data output. Memory 999 data samples. Battery and/or mains powered.
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Compact Full Automatic Vibrating Sample Magnetometer
VSM-C7
Small size and light weight system 1/5 in weight and about 1/3 in occupied floor space upon heretofore measurement tester Type VSM P7-15. This equipment is capable of measuring all merchandized memory media and low in price.
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Handheld Metal Hardness Tester
TIME®5330
Beijing TIME High Technology Ltd.
Handheld Metal Hardness Tester TIME®5330 is loaded with 4.3 inch LCD screen and a large memory of 2000 groups of data. Built-in conversion table enables you to read HB value directly if D/DC impact devices are installed.
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Sonel Make Digital Insulation Resistance Tester
Sonel (Poland) Digital Insulation Resistance Tester, Range : 0-5kV/5TeraOhms, Battery-cum-Mains Operated, Voltage increment in Steps of 50v & 100V upto 5kV, Memory storage upto 11880 records, Data Transfer to PC/Laptop by USB Port, Free Software, PI & DAR Measurements.
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Folding Tester
DRK111B
Shandong Drick Instruments Co., Ltd.
DRK111B Folding Tester is designed according to relevant standards and adopts modern mechanical philosophy and computer processing technology. It has LCD display function, various parameters setting function, conversion, adjust, memory, printing, and other functions.
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Digital Leeb Hardness Tester
TIME®5310
Beijing TIME High Technology Ltd.
TIME5310 is an advanced digital Leeb hardness tester developed with advanced micro electronic technology. It is loaded with all the features for metal hardness testing, such as probe auto recognition, large memory, USB output, removable printer, software, etc. The improved display makes it is much easier to read the values. TIME5310 digital hardness meter is a must have for testing in the field or in the lab. By the way, there are newly designed probes for this hardness meter now.
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Automated Wafer Prober for Magnetic Devices and Sensors
Hprobe design and fabricate turnkey automated testing equipment (ATE) for electrical characterization and testing of integrated circuits under magnetic field such as MRAM (Magnetic Random Access Memory) and sensors. In each phase of the technology and product development as well as during mass manufacturing, a dedicated magnetic tester is available.
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Memory Tester
RAMCHECK LX DDR3
Quickly test DDR3 DIMM and SO-DIMM memory. In just seconds, RAMCHECK LX will perform a thorough test of the module and provide complete identification. Also tests expensive LRDIMM modules.
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Memory Test Systems
T5503HS2
Semiconductor memories are in high demand to meet the needs of fast-growing end markets such as portable electronics and servers. It has been forecasted that applications ranging from mobile devices and data centers to automobiles, gaming systems and graphics cards will consume an estimated 120 billion gigabits of DRAM capacity. To meet this market demand, new generations of memories with data-transfer speeds of 6.4 Gbps and higher are being developed. Advantest’s second-generation T5503HS2 tester is designed to handle these ultra-high-speed memory ICs.
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Portable Force/Displacement Tester
The FSA-MSL Mini Material Tester is a portable force/displacment tester. The FSA-MSL is ideal for tests requiring very small movement, like switch tests. The tester also features a reversible base plate, allowing the tester to be used on uneven or obstructed surfaces. The highly visible EL display and plain language menus in eight languages make programming fast and easy. Both force and displacement values are displayed plus user-selectable data; high/low setpoints, peak, memory data, etc.
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Memory Tester for DDR4 DIMMS
RAMCHECK LX
USBWith the RAMCHECK LX DDR4 memory tester package (part number INN-8686-DDR4) you can quickly test and identify DDR4 DIMMs that comply with JEDEC standards. Tests are fast, reliable and easy to do. The RAMCHECK LX DDR4 package includes the RAMCHECK LX base tester and 288-pin DDR4 DIMM adapter. (This package is also available with the DDR4 DIMM Pro adapter, featuring a very rugged test socket).
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Test Adapter
Ramcheck 100
This addition to the RAMCHECK memory tester provides needed support for testing of SDRAM and standard EDO/FPM DRAM 100-pin SO DIMM modules at an affordable price.
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Test Adapter
Ramcheck 72 Pro
Our latest addition to the RAMCHECK memory tester provides needed support for testing 72-pin SO DIMM modules used in older laptop computers. The RAMCHECK memory tester automatically detects the presence of the RC 72 Pro adapter
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Crush Tester 350
DRK113
Shandong Drick Instruments Co., Ltd.
DRK113 Crush Tester 350 is a high accuracy and intelligent instrument, designed according relevant standards. The advanced components, mating parts and micro-computer are logical structured, to ensure the property and appearance. The instrument have parameter testing, adjusting, LCD digital display, memory, printing function.
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Flex Socket Test Module
JT 2127/Flex Socket Test Module
The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
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Optical Power Meter & VFL & RJ45 Network Test
TM263N
◇ Added Network Cable Test ◇ Accurately test whether a single network cable transmits signals normally ◇ Self Calibration ◇ Set the Auto Off ◇ Wavelength Memory function after turn off the tester ◇ High Accuracy, high ,High sensitivity, high linearity ◇ Stable VFL Output ◇ USB Charge port ◇ FC,SC Connector ◇ 18650Li-ion Battery ◇ Lower power consumption design, long standby time ◇ Rubber Out shell, increased the protective properties for field work
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SD & Micro SD Duplicators And Testers
International Microsystems Inc.
International Microsystems makes the best SD and Micro SD card tester / copier and duplicator on the market. We can quickly clone your SD memory cards with our fast 8, 16, and 32 slot machines. Our ease-to-use tester/ duplicators support stand-alone operation.
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Application Level Tester
The application tester tests the memory devices such as graphic memory and HDD buffer memory in a specially designed condition made similar to actual PC and Server environments. In fact the graphic memory has releatively higher speed, test expense and quality standard compared to main memory, stressing the importance and the need of the application tester.
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Hi-Pot Tester
DU3315A/3316A
Delta United Instrument Co., Ltd.
Real-time Open Check of the alarm and signal output of no contact signal3 in 1 tester with AC, DC, IR functions ( IR function is optional for DU3316 only)ARC Detction:DU3315A /DU3316A Standard function40 x 4 LCD text displayFast cut-off time : 0.4ms5 sets of memory, 3 steps for each memory
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Digital/Pattern/PE Card
QSPI
The QSPI represents a multi-function of performanceand capabilities for PXI-based digital instrumentation.The QSPI offers high performance pin electronics and 4I2C masters and 4 32bit counter 4 clock generator in acompact, 3U PXI form factor. Each card can function asa quad sites I2C/SPI device tester, multiple cards can beinterconnected, supporting up to 64 sites. The QSPI alsosupports deep pattern memory by offering 32M of onboard vector memory with dynamic per pin directioncontrol and with test rates up to 10 MHz.
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Solderability Tester
LBT210
Microtronic Microelectronic Vertriebs GmbH
Microtronic's LBT-210 solderability tester has software that offers statistical information such as mean value, standard deviation, etc. A camera option offers video of the test cycle and storage in memory with the appropriate test measurements and data. Additionally, it has the feature to test under nitrogen. This function can be switched on in the software. An enclosure that is flooded with nitrogen lowers and rises with the device under test.
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Single Event Effects Test System
SEE-RAD
The SEE-RAD test system brings together the proven features of our ETS780 tester (such as true APG memory test and powerful FA tools) with the newest technology of the Griffin III. With all new high-accuracy DC Parametrics, superior precision pin drivers, and capture memory of 64M, the Griffin SEE-RAD combines the newest innovations in the test industry with our years of experience in Radiation Test.
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Turns Ratio Testers
TRT Standard Series
When it comes to choosing a transformer turns ratio tester, TRT Standard series offers some of the most advanced instruments with LCD display out in the market. Each model measures transformer excitation current and phase shift performs automatic vector group detection and magnetic balance on three-phase transformers and three-phase autotransformers. Furthermore, they have a built-in true three-phase power source. Because of that, TRT Standard instruments can test transformers with special configurations, such as phase-shifting, rectifier, arc-furnace, traction transformers, etc.The instruments can output test voltages from 1 V AC to 250 V AC, depending on the chosen model. High test voltage of 250 V AC provides more accurate turns ratio testing compared to other turns ratio testers on the market and extremely low test voltage of 1 V AC enables turns ratio verification of current transformers.TRT Standard series consists of:TRT03 Models (TRT03A, TRT03B, TRT03C) – single-phase voltage up to 100 VTRT3x Models (TRT30A, TRT30B, TRT30C, TRT33A, TRT33B, TRT33C) – single and true three-phase voltage up to 100 VTRT63 Models (TRT63A, TRT63B, TRT63C) – single and true three-phase voltage up to 250 VMore about models differences can be found under the downloads tab, in brochures and comparison sheets.A user can create test templates using the DV Win software and store them in the PC’s memory for later use when in the field.TRT Standard series models have a built-in tap changer control unit. Consequently, it enables remote control of an on-load tap changer (OLTC) directly from the tester. In order to make the most out of this feature, the DV-Win software can be programmed to do everything automatically – running turns ratio tests, changing OLTC tap positions and saving results. This option, especially in combination with test templates, significantly facilitates and shortens the turns ratio testing time.
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Memory Tester
SP3000
CST is proud to offer a portable stand alone and affordable memory tester, combining DIMM and SODIMM testing capability all on the same universal base unit with optional easy plug-on test adapters.
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0-5KV Digital Hi-pot Tester 0-5KV
7110
Shenzhen Chuangxin Instruments Co., Ltd.
Programmable AC/DC withstand voltage tester Feature: Small volume, light weight Easy to operate, has keyboard lock function Provide 5 groups memory setting, each group has four kinds of work mode
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SD Host Tester / SD / EMMC Analyzer / SD Card Tester
SGDK320A (SD Host Tester)
SGDK320A (SD Host Tester) is a product that has the functions of SD emulator (SD Emulator), host tester (Host Tester), SD analyzer (SD Analyzer), and eMMC analyzer (eMMC Analyzer). Supports SD Memory Card Physical Layer Specification Version 3.01. It covers the test contents of Test Specification Ver3.00 and Supplement Note. Supports SDR104 and eMMC ver4.41 (analyzer).
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Flash Memory Test System
T5830
T5830 memory tester, the latest member of its T5800 product family, optimized for testing a wide range of flash memory devices used in mobile electronic devices. The highly flexible T5830 tester has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories.
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Gear Teeth Hardness Tester
PHT-1840
This dedicated unit is designed to test gear teeth and other difficult to access applications. The 1840 is loaded with the same features found on the base 1800 version which includes memory, USB output and software for downloading to your PC. The 1840 hardness tester is capable of measuring the surface hardness of a broad variety of metals on flat and round surfaces. This instrument comes complete with a dedicated DL impact device, calibrated test block and rugged carry case.
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Memory Tester
RAMCHECK
RAMCHECK is our most advanced memory tester and is the latest in our product line. Highly modular and user friendly, it redefines the capabilities of an affordable and portable ram checker.
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RAMCHECK LX DDR4 Memory Tester
INN-8686-DDR4
The RAMCHECK LX DDR4 quickly and accurately tests and identifies DDR4 DIMMs for servers and desktops, as well as laptop SODIMMs.
