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Near-field Scanning Optical Microscope
Near-field Scanning Optical Microscope
- Pickering Interfaces Inc.
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PXI/PXIe MEMS Optical MUX, 8-Channel, Single-Mode, 9/125 Fiber, LC Connectors
42-852A-418
The 40/42-852A-418 is a PXI/PXIe 8-channel multiplexer with LC connectors and is part of Pickering's range of PXI Fiber Optic MEMS Switching modules. They are available in many high density formats with a choice of different connector styles to suit most applications: FC/APC (for optimal performance), FC/PC and SC/PC for general applications and LC and MU for high density applications.
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Ultrafast Nearfield Optical Microscope
Femtosecond NSOM
Near-field Scanning Optical Microscope (NSOM) is a versatile tool for nano-characterization and nano-manufacturing.
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Near-Field Scanning Optical Microscope Platform
MoScan-F
MoScan-F is a device that enables you to get the best up-to-date available spatial optical resolution using the near field scanning optical microscope (NSOM) principle
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Near-field Scanning Optical Microscope
NSOM
Near-field Scanning Optical Microscope (NSOM) is a versatile tool for nano-characterization and nanomanufacturing.Conventional microscopes have fundamentally limited resolution due to diffraction, but there is no such restriction for near-field interactions, that is why near-field microscopy is becoming one of the most important techniques for nano-science.
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Automated Optical Switch - MATRIQ
Add optical switching capability to your test system with Quantifi Photonics’ automated optical switches. The fast and reliable optical switch will enable automated sequential testing, saving time and streamlining your test procedures.
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Optical-Electrical Converter - MATRIQ
The O2E is a high bandwidth, broadband optical to electrical converter.Available in a range of configurations; choose from 1 or 2 channels, AC or DC coupling and various conversion gain and operating wavelength ranges.
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Automated Optical Switch - PXI
Add optical switching capability to your test system with Quantifi Photonics’ automated optical switches. The fast and reliable optical switch will enable automated sequential testing, saving time and streamlining your test procedures.
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Broadband Optical Source - MATRIQ
Our SLED MATRIQ instrument is a compact super-luminescent LED light source with high output power, large bandwidth and low spectral ripple.The SLED comes in various wavelength models to address various key applications across telecom and datacom, and is ideal for building a customized optical testing platform that delivers reliable and repeatable results.
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Broadband Optical Source - PXI
SLED 1000 Series
The SLED 1000 Series is a super-luminescent LED light source with high output power, large bandwidth and low spectral ripple. It comes in various wavelength models to address applications in the telecom and datacom markets.The SLED is a single-slot PXIe module and is ideal for building a customized optical testing platform that delivers reliable and repeatable results in manufacturing or R&D environments.
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Laser Scanning Microscopes
A confocal laser scanning microscope scans a sample sequentially point by point, or multiple points at once. The pixel information is assembled into an image. As a result you acquire optical sections with high contrast and high resolution in x, y and z .
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Optical to Electrical Converters
High bandwidth, broadband optical to electrical converters available in a range of configurations. Choose from 1 or 2 channels, AC or DC coupling and various conversion gain and operating wavelength ranges.
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Scanning Electron Microscope
Verios G4 XHR SEM
The Thermo Scientific™ Verios G4 scanning electron microscope (SEM) provides sub-nanometer resolution from 1 to 30 kV and enhanced contrast needed for precise measurements on materials in advanced semiconductor manufacturing and materials science applications, without compromising the high throughput, analytical capabilities, sample flexibility and ease of traditional Scanning Electron Microscope (SEM).
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High-Resolution Scanning Probe Microscope
SPM-8100FM
The new HR-SPM scanning probe microscope uses frequency detection. his instrument is not only capable of ultra-high resolution observations in air or liquids, but for the first time enables observations of hydration/solvation layers at solid-liquid interfaces.
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Scanning Magnetic Microscope
Circuit ScanTM 1000
Operating circuits within a semiconductor generate external magnetic fields near the surface of the device. These magnetic fields, while weak in strength, contain information about the spatial variation of current density flowing within the circuit. Micro Magnetics has developed the CS1000 to make practical use of this information and provide engineers with valuable information about what is going on inside circuitry non-destructively.
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Scanning Probe Microscopes
SpectraView 2500
* Ultra-low noise SPM* Colocalized nanochemical analysis by IR, THz, Raman, AFM* Cantilever probes are completely transparent* Versatile configurations: Kelvin Probe chemical potential, electrical, thermal and photon force
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Optical-Electrical Converter - PXI
O2E 1000 – 1400 Series
The O2E is a high bandwidth, broadband optical to electrical converter.Available in a range of configurations; choose from 1 or 2 channels, AC or DC coupling and various conversion gain and operating wavelength ranges.
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Laser Scanning Microscopes
The Olympus FLUOVIEW confocal microscopes are designed for high-resolution, confocal observation of both fixed and living cells, enabling visualization deep within samples. From the New FV3000, optimized for the most robust interactive live cell and tissue experiments, to easy-to-use high content imaging, explore the wide range of options with Olympus exclusive optical technologies.
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Near-field Chambers
Most antenna measurements need to be carried out in the far field; that is, the test antenna should be illuminated by a plane wave. Typically this is carried out by providing sufficient separation between the source and the AUT so the spherical wave approaches a plane-wave character.
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Optical Fiber Microscope
Connector-end face contamination is a problem that shouldn’t be ignored when it comes to fiber optic cables and patch cords. Allowing contamination to take place or fester will lead to network issues and down-time which you don’t need. For any fiber optic cable network, a high quality fiber microscope is a necessary tool to identify where contamination may be presenting.
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Scanning Near Field Optical Microscope
SNOM
SNOM microscopes employ SPMs precision of piezoelectric raster-scanning together with sharp probes to obtain light optical images at rather better than the usual wavelength-limited resolution. The possibility to go beyond the Abbe diffraction limit has been achieved with the Near-field light optical microscopes (SNOM or NSOM).
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Scanning Electron Microscopes
Our Scanning Electron Microscopes (SEMs) resolve features from the optical regime down to the sub-nanometer length scale.
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Scanning Tanks
Our ultrasound test tank systems are custom built to suit your requirements and additional features can be included.
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Optical Switches
Fast and reliable optical switches to streamline your test procedures. Can be customized with a wide range of switch configurations, fiber types and connectors.
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Microscopes
A digital or traditional optical microscope can help engineers check on their high-speed probing activities much more easily. It will assure the probe tips will touch on the right contact(s), with correct contact angle and right amount of force. We use both digital and optical microscopes in our own lab. The information in this page is to help you choose a microscope best suits you.
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Scanning Electro-chemical Microscope
920D
The scanning electrochemical microscope (SECM) was introduced in 19891 as an instrument that could examine chemistry at high resolution near interfaces. By detecting reactions that occur at a small electrode (the tip) as it is scanned in close proximity to a surface, the SECM can be employed to obtain chemical reactivity images of surfaces and quantitative measurements of reaction rates.
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Microscopes
Bruker's world-leading microscopy systems are helping scientists and engineers to make breakthrough discoveries and develop new applications and products that improve nearly all aspects of our world. Our microscopes enable scientists to explore life and materials at the molecular, cellular and microscopic levels.
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Scanning Tunneling Microscope for Ultra High Vacuum
STM
A.P.E. Research instrument is a versatile Scanning Tunneling Microscope, STM, capable of scanning samples of almost any size. It can operate in UHV and in air. The systems have been designed to evaporate (e.g. metals, organic molecules) in UHV directly onthe sample mounted on the STM head.
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Scanning Probe Microscopes
attoMICROSCOPY
The mission to create scientific impact has kept attocube at the frontier of cutting edge research instrumentation. Decades of combined experience in all relevant fields, an excellent team, and close cooperations with some of the world’s leading research institutes have evolved into a broad portfolio of high-end cryogenic scanning probe microscopes.
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Near-Field Detection Module for Spectroscopy
nanoFTIR
Reflective AFM-tip illuminationDetection optimized for high-performance near-field spectroscopyPatented background-free detection technologyBased on optimized Fourier-Transform spectrometerUp to 3 spectra per secondStandard spectral resolution: 6.4/cmUpgrade to 3 cm-1 spectral resolution availableSuited for visible & infrared detection (0.5 20 m)Exchangeable beam-splitter mount includedNEW: Suited for IR synchrotron sources
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AFM (Atomic Force Microscope) Optical Platform
The AFM platform allows fully-integrated use of confocal Raman microscopy and AFM for Tip-Enhanced Optical Spectroscopies (such as Tip-Enhanced Raman Spectroscopy (TERS) and Tip-Enhanced PhotoLuminescence (TEPL)), but also for truly co-localized AFM-Raman measurements.The myriad of AFM (Atomic Force Microscope) techniques that allow study of topographical, electrical and mechanical properties can be performed with any laser source available in Raman spectrometer, or with other external illumination (e.g., solar simulator or other tunable or continuum source). TERS and TEPL can provide nanoscale chemical and structural information, making the AFM-Raman platform a two-way road; where complimentary techniques provide novel and unique imaging capabilities to each other.
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Infrared Microscope
DDR200 & DDR300
The McBain DDR200 and DDR300 for 200mm and 300mm wafer defect detection and review are unmatched in value and features in this special application and price category. The systems offer significant and unique advantages for both production and engineering use, and provide an ideal solution when both defect detection and dimensional metrology are required.
