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Scattering
a propagating wave or moving particle's linear trajectory, interrupted by non-uniformity in the medium they move through.
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Vector Network Analyzer
SNA5000A
The SIGLENT SNA5000A series of Vector Network Analyzers have a frequency range of 9 kHz to 8.5 GHz, with 2 and 4 port models available. Designed to give you instant insight into scattering, differential, and time-domain measurements. They are effective instrumentation for determining the Q-factor, bandwidth, and insertion loss filters and feature impedance conversion, movement of measurement plane, limit testing, ripple test, fixture simulation, and adapter removal/insertion adjustments. There are five sweep types: Linear-Frequency, Log-Frequency, Power-Sweep, CW-Time, and Segment-Sweep mode. The SNA5000A series VNAs also support scattering-parameter correction of SOLT, SOLR, TRL, Response, and Enhanced Response for increased flexibility in R&D and manufacturing applications.
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Application Specific LC System
Reducing Sugar Analysis System
The Nexera reducing sugar analysis system uses Shimadzu’s unique post-column boric acid-arginine fluorescence derivatization method. Unlike the refractive index detectors and evaporative light scattering detectors (ELSD) commonly used for sugar analysis, this system reduces the effects of impurities and offers both high sensitivity and a wide dynamic range. As a result, sugars contained in samples can be analyzed simultaneously, without dilution even when there are significant concentration differences.
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Benchtop Small Angle X-ray Scattering (SAXS) Instrument
NANOPIX mini
Non-destructive measurement of particle size and size distribution.Rigaku NANOPIX mini is the world’s first benchtop small angle X-ray scattering (SAXS) system that is engineered to deliver automatic nanoparticle size distribution analysis for both quality control (QC) and research and development (R&D) applications. Nanoparticle size, size distribution, and particle shape are the key pieces of information obtained from SAXS. Samples may range from solutions, suspensions or slurries to solid plastics, rubbers or polymers.
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Particle & Molecular Size/Charge Analyzers
Zetasizer Range
Instruments in the Zetasizer range are used to measure particle and molecular size from less than a nanometer to several microns using dynamic light scattering; zeta potential and electrophoretic mobility using electrophoretic light scattering; and molecular weight using static light scattering. The Zetasizer system is available in a range of variants, including the new Zetasizer Pro and Ultra. These two new systems offer unprecedented ease-of-use and flexibility, along with empowering user guidance and novel measurement techniques such as MADLS® and Particle Concentration.
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Small-Angle X-Ray Scattering (SAXS) Products
Small-Angle X-Ray Scattering (SAXS) Products from Rigaku
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Multi-angle Polarized Light Scattering Measurements
LISST-VSF
In-situ measurements of P 11, P12 and P22 elements of scattering Mueller matrix, (P11 is VSF) from 15-150º.VSF (P11) only at small angles, 0.05 to 10º in 32 logarithmic steps in angles.Only two detectors employed with absolute radiant sensitivity (A/W) calibration.Beam attenuation measured with optics similar to our LISST-100X.Roving Eyeball™ optics permit 1-degree resolution in angles between 15 -150º.Sampling rate at 3 seconds per measurement set (involves 3 turns of Roving Eyeball with unpolarized, vertical, and horizontal polarized laser).Daylight rejection by laser modulation.Dynamic range in VSF measurements extended via laser power modulation.Data from small and large angles in a single data stream, including depth and temperature.
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Diffractometers & Scattering Systems
Bruker develops and manufactures analytical solutions for X-ray diffraction and scattering. Our innovative instruments and software support research, development and quality control in academia, governmental institutions and industry.
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Physical Contact Connectors
Amphenol Fiber Systems International
Physical Contact (PC) connections are characterized by the physical mating of two optical fibers. Precision ceramic ferrules are typically utilized for PC connections. A PC connection is accomplished by terminating the optical fiber into a precision ceramic ferrule. Epoxy is used to affix the fiber into the ferrule. The tip of the ceramic ferrule is polished in a precise manner to ensure that light enters and exits at a known trajectory with little scattering or optical loss. Polishing the terminated ceramic ferrule is a critical process in Physical Contact fiber optic connectors.
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SERS (Surface Enhanced Raman Scattering) Substrate & SERS Reader – Mini Chemistry Analytic Pack
The porous carbon SERS substrate provides not only high signal enhancement due to its strong broadband charge-transfer resonance for large chemical enhancement (as opposed to electromagnetic enhancement in traditional metal-based SERS substrates), but also extraordinarily high reproducibility or substrate-to-substrate, spot-to-spot, sample-to-sample, and time-to-time consistency in SERS spectrum (which is not possible with traditional metal-based SERS) due to the absence of "electromagnetic hot spots" by making the entire surface of the substrate "chemically hot", high durability due to no oxidization, and high compatibility to biomolecules due to its fluorescence quenching capability.
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Laser Particle Size Analyzer
Easysizer20
Zhengzhou Nanbei Instrument Equipment Co. Ltd
sysizer20 is the latest product of OMEC in Year 2006 and is highly automated, all the process can be done automatically after setting up initial parameters. Multiple sample feeding systems are available to meet your requirements. Applications：Measure the particle size distribution of powder or latex Principle：Use the principle of laser light scattering to determine particle size distribution.
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Optical VSF Sensors
The optical Volume Scattering Function(VSF) is an ‘inherent optical property’ of water that is used by optical oceanographers to predict light propagation, image degradation, remote sensed ocean color, biological environment etc. in water.
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Particle Size Analyzers
NanoBrook Series
Brookhaven Instruments Corporation
Rapid and accurate protein & nanoparticle size distributionsMultimodal & unimodal size distribution softwareISO 13321 and ISO 22412 compliant resultsRange: < 0.3 nm to 10 mThree measurement angles: 15, 90, and 173Ideal for fast, routine sizing applications in research or quality controlHigh power 35 mW diode laserDynamic light scattering at 173 and 90Temperature control, -5 C to 110 CCompact bench top unit, USB connectionMolecular weight determination (relative and absolute through Debye plot)
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Network Analyzers
A network analyzer is an instrument used to analyze the properties of electrical networks, especially those properties associated with the reflection and transmission of electrical signals known as scattering parameters (S-parameters). Network analyzers are used mostly at high frequencies; operating frequencies can range from 9 kHz to 110 GHz
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Laser Scattering Particle Size Distribution Analyzer
Partica mini LA-350
HORIBA's new LA-350 Laser Diffraction Particle Size Distribution Analyzer is the ideal combination of performance, price, and packaging. The LA-350 excels in applications as diverse as slurries, minerals, and paper chemistry. Based on the advanced optical design of previous LA-series analyzers, the LA-350 strikes a harmonious balance between high-functionality, easy operation, low maintenance, and cost-effectiveness.Bench space is used efficiently due to the LA-350’s compact size (297 mm x 420 mm). The clever design and precision, high quality manufacturing ensure convenient, reliable operation and accurate results, now with a wider size range (0.1-1,000 µm).
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Hybrid Raman/Er-doped Fiber Amplifier
HFA5000
Hangzhou Huatai Optic Tech. Co., Ltd.
1. Erbium-doped Fiber Amplifier, due to multiple cascades and the accumulation of noise caused by spontaneous emission, will reduce the system CNR greatly and thus it will limit the transmission capacity and distance of the system. Raman Fiber Amplifier (RFA) is a newly designed fiber amplifier based on Stimulated Raman Scattering (SRS) effect. It is considered as the core technology of new generation DWDM fiber over-long communication. Compared with Erbium-Doped Fiber Amplifier, Raman amplifier has the advantage of low Noise Figure (NF), wider gain bandwidth, flexible gain spectral region and stable temperature. It is the only device that can operate in 1300~1600nm.
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C-Band Separate Dispersion Compensation Raman Fiber Amplifier
DRA5228/F
Hangzhou Huatai Optic Tech. Co., Ltd.
Raman Fiber Amplifier (RFA) utilizes the optic gain in the Stimulated Raman Scattering (SRS) in the optical fiber and realizes the amplification of the signal optic. FRA, with very low equivalent noise and a wide gain scope, can further widen the gain bandwidth by adopting multi-wavelength optical bump, which represents the development direction of the new optical fiber amplifier.
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L-Band Separate Raman Fiber Amplifier
RFA6000
Hangzhou Huatai Optic Tech. Co., Ltd.
1. Erbium-doped Fiber Amplifier, due to the multiple cascades and the accumulation of noise caused by spontaneous emission, will reduce the system CNR greatly and thus it will limit the transmission capacity and distance of the system. Raman Fiber Amplifier (RFA) is a newly designed fiber amplifier based on Stimulated Raman Scattering (SRS) effect. It is considered as the core technology of new generation DWDM fiber over-long communication. Compared with Erbium-Doped Fiber Amplifier, Raman amplifier has the advantage of low Noise Figure (NF), wider gain bandwidth, flexible gain spectral region and stable temperature. It is the only device that can operate in 1300~1600 nm.
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Sample Analysis Services
Postnova Analytics offers a variety of unique sample analysis services for the characterization of biopolymers, proteins, liposomes and nanoparticles. Our European Application Laboratory Center EAC and our American Application Laboratory Center AAC represent the worldwide biggest and most advanced labs offering sample analysis services based on Field-Flow Fractionation and Light Scattering.
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Solar Cell Simulation
Setfos
Easily calculate the short circuit current, open circuit voltage Voc and fill factor with Setfos. Tweak the layer stack and add light scattering layers for enhanced absorption. Optimize for AM1.5 or specific wavelength bandsElectrical IV curvesCurve fitting & parameter extractionAC simulation and transient experiments like photo-CELIVAdvanced device physics: SRH-recombination, excitons, ... Design anti-reflection coatings or transparent cells
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Water Treatment Plant Analyzer
Aqualog® is the only instrument to simultaneously measure both absorbance spectra and fluorescence Excitation-Emission Matrices. EEMs are acquired up to a 100 times faster than with other instruments. Dedicated software automates traceable Quinine Sulfate Unit calibration and correction of inner-filter effects and Rayleigh and Raman scattering lines, enabling rapid export to modeling algorithms like PARAFAC.
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Evaporative Light Scattering Detector
ELSD-LTII
The ELSD-LTII utilizes a high-efficiency LED and enhanced digital signal treatment to minimize noise and deliver optimum sensitivity for trace analysis. An innovative cell design also reduces band broadening and allows sensitivity levels below 200 picograms. The high-performance optical detection system can also be used for combinatorial chemistry and high-throughput screening applications. The new Low Temperature Evaporative Light Scattering Detector (ELSD-LTII) is an easy-to-operate, universal detector that identifies analytes with uniform sensitivity regardless of their spectroscopic properties. It is not a spectroscopic detector. Instead, it removes the mobile phase through evaporation and then makes a light scattering measurement of the dried analyte particles.
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X-Ray Photoelectron Spectrometer
AXIS Supra
AXIS SupraTM is an X-ray photoelectron spectrometer (XPS) with unrivalled automation and ease of use for materials surface characterisation. The patented AXIS technology ensures high electron collection efficiency in spectroscopy mode and low aberrations at high magnifications in parallel imaging mode. XPS spectroscopy and imaging results can be complemented by additional surface analysis techniques such as: ultraviolet photoemission spectroscopy (UPS); Schottky field emission scanning Auger microscopy (SAM) and secondary electron microscopy (SEM) and ion scattering spectroscopy (ISS). The AXIS Supra replaces the AXIS Ultra DLD as Kratos' flagship x-ray photoelectron spectrometer.
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Multiphoton Laser Scanning Microscope
FVMPE-RS
The Olympus FVMPE-RS multiphoton imaging system is purpose-built for deep imaging in biological tissue, aimed at revealing both detail and dynamics. Innovative features for efficient delivery and detection of photons in scattering media enable high signal-to-noise ratio acquisition. This translates to bright images with precise details — even from deep within the specimen. High sensitivity is matched with high-speed imaging to capture rapid in vivo responses. For advanced applications, dual-wavelength excitation extending to 1300 nm is available. Independent control of visible or multiphoton laser light stimulation and the ability to synchronize with patch clamp data are also possible.
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VIS/NIR Sensor
AF26
The AF26 is a high precision dual channel color sensor for inline operation; the secondary wavelength is designed to compensate the desired light absorbance measurement from any undesired light scattering influence, such as suspended solids, gas bubbles, immiscible fluids or window fouling. The AF26 sensor’s output can be correlated to almost any color scale including APHA and Hazen.
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Integrated Modular Electromagnetic Modeling Suite
EM.Cube
EM.Cube® is an industry-recognized simulation suite for electromagnetic modeling of RF system engineering problems. It features several distinct simulation engines that can solve a wide range of modeling problems such as electromagnetic radiation, scattering, wave propagation in various media, coupling, interference, signal integrity, field interactions with biological systems, etc. Using EM.Cube, you can solve problems of different sizes and length scales, varying from a few microns in MEMS devices to several miles in large urban propagation scenes.
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UltraScan VIS Spectrophotometer
Hunter Associates Laboratory, Inc.
The UltraScan VIS easily measures both reflected and transmitted color as well as transmission haze and meets CIE, ASTM and USP guidelines for accurate color measurement. UltraScan VIS uses diffuse/8° geometry with automated specular component inclusion/exclusion. For transmission measurement, the use of a robust CIE-conforming sphere instrument (TTRAN Total Transmission mode) effectively negates the effects of minor scattering typically found in transparent samples.
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Field-installation Type Turbidity Meter (Four-Wire Transmission, High-sensitivity)
HU-200TB-H
HU-200TB-H connects flow-through type turbidity sensor (SS-120-H) and measures turbidity. It accurately measures turbidity in the range of low to medium concentration (10 degrees) by the 90-degree transmission scattering method with less stray light.Optimal for control and monitoring of wastewater treatment and production processes.
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Dynamic Light Scattering Systems
Since the release of the UPA in 1990, Microtrac would go on to become the preferred manufacturer of Dynamic Light Scattering instrumentation for nano-particle measurements. What makes our systems unique is our proprietary approach to Dynamic Light Scattering, which allows us to measure from sub-nanometer to several microns, in addition to, the ability to characterize the widest concentration range on the market.
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3D Electromagnetic Simulation Software
XFdtd®
A full-featured simulation solver, XFdtd outpaces other methods in efficiency as the number of unknowns increases. XF includes full-wave, static, bio-thermal, optimization, and circuit solvers to tackle a wide variety of applications, including antenna design and placement, biomedical and SAR, EMI/EMC, microwave devices, radar and scattering, automotive radar, and more. It also works with Remcom's ray-tracing products to provide thorough simulation capability at the low-, middle-, and high-end of the electromagnetic spectrum.
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Aerosol And Dust Monitors
Aerosol monitors, commonly referred to as dust monitors, particulate monitors, light scattering laser photometers, and nephlometers, are used to measure dust, smoke, mist, fume, condensates, and fog. TSI Aerosol Monitors offer real-time, direct-reading results, which is quickly becoming an industry best practice in occupational hygiene, indoor air quality, and outdoor environmental fugitive emissions monitoring.
