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- Pickering Interfaces Inc.
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PCI Precision Resistor Card 9-Channel, 1Ω To 122Ω
50-297-112
The 50-297 provides a simple solution for applications requiring accurate simulation of resistive sensors. The 50-297 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Test Equipment
Southern Photonics designed and manufactured all the test equipment currently being manufactured by Coherent Solutions, as well as equipment for non-telecoms applications. This includes FBG strain interrogators, optical pulse phase analysers, OSNR meters, optical power meters, optical spectrum analysers, optical gas sensors… you get the idea. All test equipment we build is robust and easy to use. The picture shows some of what we can do – anything from prototype benchtop test gear (as in the combination ASE source and laser combiner on top of the stack) to field test equipment (the portable fast OSA on the bottom).
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Reach-In Xenon Lamp Weathering Test Chamber
Weiber xenon lamp chamber uses xenon lamp to simulate the whole sunlight spectrum that can produce many destructive effects on the products. This simulation environment provided in the chamber is used to test the resistance of various manufactured products towards these destructive conditions. This chamber is used for quality control, product development and scientific researches and many more. With a variety of models and options, you can customize your chamber to fit your testing needs. Reach in chambers provide a compact testing area for small applications. These are easy to install, transport and occupies less space.
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1GbE/10GbE Test Blade with Line-Rate L4-7 Application Performance
Xcellon-Ultra NP Load Module
Keysight Network Applications and Security
Ixia''s Xcellon™ load modules are the highest performing and most scalable application traffic generation solution available in the industry. The Xcellon-Ultra™ NP offers complete layer 2-7 packet generation, routing, and application testing functionality in a single load module.
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Power Supply Test System
The Procyon PTS 2100-10 is a configurable turnkey Power Test System, delivering automated test equipment (ATE) to some of the world’s largest-volume manufacturers as well as the affordability needed by niche market producers. Aerospace, defense, and avionics power supply ATE test systems applications include functional testing of AC and DC power supplies, generator, and engine control units, as well as a wide range of associated electronics.
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PXI Precision Resistor Module 9-Channel, 2 to 26.7k
40-297-032
This 9-channel PXI Precision Resistor Module provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-297 series is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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PXI-2510, 68-Channel, 2 A PXI Signal Insertion Switch Module
778572-10
68-Channel, 2 A PXI Signal Insertion Switch Module—The PXI‑2510 fault insertion unit (FIU) is designed for hardware‑in‑the‑loop (HIL) applications and electronic reliability tests. Each module has a set of feedthrough channels that you can open or short to one or more fault buses. You can use this architecture to simulate open or interrupted connections as well as shorts between pins, shorts to battery voltages, and shorts to ground on a per-channel basis. When controlled with the LabVIEW Real-Time Module, the PXI‑2510 is ideal for validating the integrity of control systems including engine control units (ECUs) and full authority digital engine controls
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PXI 3A Power MUX BRIC, 4-Channel, 12-Pole
40-571-301
The 40-571 is a Power Multiplexer designed to simplify the connection of a common set of test equipment to one of a number of different devices for testing (simultaneous multiple channel selection is possible for most configurations, see switching specifications for restrictions). It is ideal for applications where the equipment needs to conduct the same test process on a series of similar devices one at a time. It is available in a variety of configurations that allow testing with differing number of devices to be tested and different connection widths to suit differing test equipment pin counts.
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6-Slot LXI/USB Modular Chassis With Scan List Sequencing & Triggering
60-106-002
Pickering Interfaces’ 60-106-002 modular LXI/USB chassis occupies only a small, 1U rack-height form factor, making it suitable for portable and space-restricted rack-mount applications. It features remote control via USB or LXI Ethernet and this version of the chassis includes Scan List Sequencing & Triggering. Remote control over a network enables the switching function of a test system to be located as close as possible to the target equipment.
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RF/Switching
SMX-6XXX (RF/Switching)
The VTI SMX-6xxx Series of high density non-blocking RF multiplexers deliver exceptional performance and reliability in a compact single-slot configuration. Front panel connectivity is available in both SMB and PKZ formats to integrate seamlessly into new or existing test systems. Embedded virtual schematic control further simplifies setup and debugging allowing all relays to be engaged independent of application software and device drivers.The SMX-6xxx Series delivers unmatched bandwidth and isolation performance resulting in exceptional measurement integrity that is ideal for the most demanding aerospace, defense and automotive automated test equipment (ATE) applications.
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Crash Simulation Systems
The crash simulators are capable of reproducing a wide range of standardized and user-defined crash tests including advanced applications such as side impact and vehicle pitch simulation. Instron’s acceleration sled systems are used for the development and approval of vehicle safety systems, vehicle parts and also for the investigation of solids and structures during crash events.
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NI Software Suites
NI software suites aggregate the most popular LabVIEW add-ons and other application software typically combined with LabVIEW and other development environments to help you build test, design, and control applications. Each suite, excluding the Multi-IDE Bundle and the Software Platform Bundle, also includes one year of unlimited access to professional training and certification.The suites come with related NI device drivers and are shipped on USB 3.0 media to speed up your installation.The NI Automated Test Software Suite combines LabVIEW, LabWindows/CVI, and Measurement Studio with the TestStand ready-to-run, customizable test executive and the Switch Executive intelligent switch management and routing application to help you build manufacturing or production test systems.The NI Embedded Control and Monitoring Software Suite features LabVIEW and the recommended add-ons specifically for building embedded control and monitoring systems on NI reconfigurable I/O (RIO) hardware. The LabVIEW FPGA Module extends the LabVIEW graphical development platform to target FPGAs on NI RIO hardware, and the LabVIEW Real-Time Module builds on LabVIEW to deliver a programming environment for creating reliable, deterministic, and stand-alone embedded systems.The NI HIL and Real-Time Test Software Suite combines LabVIEW with VeriStand, a configuration-based software environment for efficiently creating real-time test applications. It also includes the LabVIEW Control Design and Simulation, LabVIEW Real-Time, and LabVIEW FPGA modules.To learn more about each suite, use the navigation options on the left side of the page.The mark LabWindows is used under a license from Microsoft Corporation. Windows is a registered trademark of Microsoft Corporation in the United States and other countries.
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PXIe-6124, 4 AI (16-Bit, 4 MS/s/ch), 2 AO, 24 DIO, PXI Multifunction I/O Module
780536-01
PXIe, 4 AI (16-Bit, 4 MS/s/ch), 2 AO, 24 DIO, PXI Multifunction I/O Module—The PXIe‑6124 is a simultaneous sampling, multifunction DAQ device. It offers analog I/O, digital I/O, two 32‑bit counters, and analog and digital triggering. The PXIe‑6124 is ideal for a variety of applications, such as IF digitization; transient recording; ISDN, ADSL, and POTS manufacturing test in the telecom industry; ultrasound and sonar testing; and high-energy physics. The included NI‑DAQmx driver and configuration utility simplify configuration and measurements.
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AC Hipot Test Set
Weshine Electric Manufacturing Co., Ltd
AC Hipot Test Equipment for Dielectric Withstand Test are suitable for 50 / 60 Hz AC testing of low capacity test objects. Optionally, these units can also be upgraded to function as DC test sets by mounting the rectifier attachment on top of the transformer.Weshine® AC Hipot Test Set for AC hipot test can be equipped with a rectifier attachment for DC voltage testing.Typical application areas:Testing of cables Testing of switchgearTesting of transformersTesting of CP & PTTesting of MV systems
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Caibration Equipment For Lab Use
In the field of high-power semiconductor testing, PONOVO has launched a smart test platform with high-speed high-frequency, high-voltage, high-current power sources, combined with high-speed, high-precision high-voltage, high-current analog acquisition technology and high-speed digital processing control system. The platform can complete the testing of dynamic parameter parameters, static parameters, thermal parameters and mechanical parameters, and power life parameter of various types of high-power semiconductor devices, modules, and chips, which could meet different testing requirements. It is the universal testing platform for automated testing for different application purpose, such as the research and development testing, engineering acceptance test, factory acceptance test, etc.
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Two-Way Optical Loss Test set
KI23403OLV-INGAAS-APC
A Dual Two-Way Optical Loss Test set (OLTS) that's perfect for medium to ultra high fiber count loss, length and optical return loss testing applications on multimode fiber at 850 / 1330nm. A pair of these compact instruments set new standards of productivity, accuracy and ease of use. A multimode APC connector on this model is required for reliable ORL test performance.
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Pressure testing solutions
Pressure testing involves applying stored energy to an assembly of parts, in order to verify its strength, its integrity and/or its functionality. Pressure Testing generally uses the application of a test fluid (liquid or gas) into a volume and the fluid is then pressurised to exert pressure forces onto the test object that can be measured.
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PXIe Embedded Controller Module
43-920-001
The 43-920-001 Gen 4 PXIe embedded controller is the most compact and powerful 3U single-slot embedded controller for the PXI Express and CompactPCI Express platforms. With its huge and future-ready interface capabilities, it is designed to handle the most demanding test and measurement applications.
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Test Automation
Write tests in plain-speak and refactor fearlessly so your test suite adapts as your application evolves. Gauge’s pluggable architecture allows you to customize your environment so you can write tests in the language and IDE of your choice.
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GaAs pHEMT MMIC Power Amplifier, DC - 28 GHz
HMC994APM5E
The HMC994APM 5E is a GaAs pHEMT MMIC Distributed Wideband Power Amplifier which operates between DC and 28 GHz. The amplifier provides 15 dB of gain, +29 dBm of saturated output power, and 25% PAE from a +10V supply. With up to +38 dBm Output IP 3 the HMC994APM 5E is ideal for high linearity applications in military and space as well as test equipment where high order modulations are used. The HMC994APM 5E exhibits a positive gain slope from 2 to 20 GHz making it ideal for EW , ECM, and test equipment applications. The HMC994APM5E amplifier I/Os are internally matched to 50 Ohms and is packaged in a leadless QFN 5x5 mm surface mount package.
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PXIe-4154, 2-Channel, 8 V, 3 A PXI Programmable Power Supply
781155-01
2-Channel, 8 V, ±3 A PXI Programmable Power Supply—The PXIe‑4154 is a specialized programmable power supply for battery simulation. It is designed to simulate a lithium‑ion battery cell’s transient speed, output resistance, and 2‑quadrant operation (source/sink). Critical to many RF and wireless applications, the simulator’s fast transient response time allows it to rapidly respond to changes in load current with minimal voltage dip, which makes the PXIe‑4154 ideal for powering devices under test (DUTs) such as RF power amplifiers, cellular handsets, and a variety of other mobile devices. To model the behavior of a battery more accurately, you can use the onboard programmable output resistance to simulate a battery’s internal resistance. For quiescent and standby current measurements, the PXIe‑4154 features integrated current measurement.
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Image Sensor Testing
IP750Ex-HD Family
The IP750EX-HD has been the test platform that has enabled the industry to manufacture high quality CCD and CMOS image sensors, and it is the most economical platform to meet the needs of newer technologies such as Time of Flight (ToF) sensors. When you use a smartphone, high performance digital still camera, or in-home security and surveillance system, these applications have image sensors most likely tested by Teradyne’s IP750ExHD.
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PXI 3A Power MUX BRIC, 24-Channel, 12-Pole
40-571-306
The 40-571 is a Power Multiplexer designed to simplify the connection of a common set of test equipment to one of a number of different devices for testing (simultaneous multiple channel selection is possible for most configurations, see switching specifications for restrictions). It is ideal for applications where the equipment needs to conduct the same test process on a series of similar devices one at a time. It is available in a variety of configurations that allow testing with differing number of devices to be tested and different connection widths to suit differing test equipment pin counts.
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Single Channel Telemetry
Our comprehensive line of telemetry products includes battery and induction powered products to meet the most demanding applications in automotive, agricultural, aerospace & defense, wind power plant, test benches, brushless motors and generators, and industrial applications.
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PXI High Density MUX BRIC, 6-Chan, 80-Pole
40-570-113
This range of High-Density Multiplexer is part of our BRIC family. These MUX's are designed to simplify the connection of a common set of test equipment to one of a number of different devices for testing (simultaneous multiple channel selection is also possible, without limitation). These multiplexers are ideal for applications where the equipment needs to conduct the same test process on a series of similar devices one at a time. They are available in a variety of configurations that allow testing with differing number of devices to be tested and different connection widths to suit differing test equipment pin counts. All version are supported in a BRIC8 construction that occupies eight PXI 3U mechanical slots, one of which provides the PXI interface and power.
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USB 2.0 Type A (With Cord And Plug) Test Connector
Test connector for USB 2.0 with cord and plug (4 pole) for contacting USB interfaces. Application in USB devices like hard disks, data carriers, power supplies, etc.
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Test Automation Platform Deployment System
KS8000A
TAP is a modern Microsoft .NET-based application that can be used stand-alone or in combination with higher level test executive software environments. The Keysight KS8000A Test Automation Platform (TAP) Deployment System provides a lower cost, scaled down alternative to the full KS8400A TAP Developers System without the graphical user interface, results viewer and timing analyzer. Deploy your existing test software and TAP plugins into manufacturing environments using the KS8000A command line interface or your own interfaces.
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Advanced Power System - DC Power Supply, 9 V, 200 A, 2000 W
N6970A
The N6970A is designed for automated test equipment (ATE) applications where high performance is critical.
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Miniature AE Sensor With Isolated Integral 30 DB
The Guzik miniature AE sensor with isolated integral 30 dB preamplifier has a wide-band and excellent frequency response over the range of up-to 1 MHz. Its small size makes the sensor ideal for hard disk drive test or similar applications requiring very small size, low weight, wideband AE sensor response and high sensitivity. A small diameter, external flexible cable connects the sensor with a 3-pin JST connector on the other end.
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Advanced Power System - DC Power Supply, 80 V, 25 A, 2000 W
N6974A
The N6974A is designed for automated test equipment (ATE) applications where high performance is critical.
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High Performance Chipscale Test Sockets
SC
Ardent Concepts Test Sockets for ATE test deploy patented SC Contact Sets. This technology is capable of over 2 Million mechanical insertions in production environments and uses easy to replace pins with no complicated assembly procedure. It is designed to be drop-in compatible with 1mm offset and straight through footprints to ease implementation, and RC SC’s simple and robust design is extremely cost effective when compared with existing “roll” type test contactors and sockets. Designed specifically for JEDEC QFN and MLF applications, SC High Performance Test Sockets are available for most handler set-ups and offer exceptional AC performance.
