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Test System
LPDDR4 and LPDDR3
Testing LPDDR4, LPDDR3 devices is made fast and simple with the "Lower Power" LPDDR4/3 TCE-3200LP IC test system. It can be configured up to 32 sites in parallel and integrated with the customer's selected handler.The TCIII-3200LP system can be used as a production tool as well as an engineering tool. To assist manufacturers and integrators, TurboCATS has developed a heat chamber that can be integrated with the TCE-3200LP, LPDDR4 and LPDDR3 test system. This allows the devices to be tested while being exposed to heat conditions.
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Imaging Gauge Software Test System
The IMAGING GAUGETM quality analysis system was developed by APPLIED IMAGE to address the growing need to standardize the evaluation of camera image quality. The system includes a Test Chart manufactured using our ACCUedge® technology, along with unique Image Analysis Software, used together to analyze the quality of the imaging system, and then provide a summary report on the various image quality metrics. Our goal is to provide a simple to use, unique image analysis system, that can be utilized by R&D, scientists, system integrators, technicians and field operators to evaluate the camera quality or imaging system.
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Inertial Systems
ACEINNA’s inertial systems provide end-users and systems integrators with fully-qualified MEMS-based solutions for measurement of static and dynamic motion in a wide variety of challenging environments, including; avionics, remotely operated vehicles, agricultural and construction vehicles, and automotive test.
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Functional Systems
ValidATE
Designed for electronics needs, keeping into account also the future implementations, the ValidATE system features complete test solutions for Legacy Replacement of systems like GR179X, GR275X, L200, L300, Schlumberger S7XX and other. The open and modular architecture of its hardware and software components makes the Valid technology available also in the solutions Valid MT, to meet the needs of STE system integrators, or to bring new electronics over old testers to replace the outdated.
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Test Cell Controller
RAPID
The Rapid II Test Cell Controller is an integrated, multi-loop control and data acquisition system for test cell applications, designed to provide maximum performance at an affordable price. Rapid II combines the latest in digital control technology with off-the-shelf hardware to produce one of the industry's most powerful, flexible and advanced controllers at a cost-effective price. This high-speed, 4-channel PID controller includes ample I/O to act both as a system controller and a data acquisition system, reducing overall system cost and complexity. Designed for integrators, OEMs, and DIYers, these systems can be configured to fit your needs with little upfront costs and minimal risk while benefiting from a stable, powerful platform.
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Test Executive for Visual Development, Database Storage, and Run-Time Execution of Test Strategies
TestBase
TYX TestBase is a test executive that supports the visual development, database storage and run-time execution of test strategies (also known as test plans or test sequences).TestBase integrates third-party applications such as: test programming languages, document viewers, report generators, database engines, Configuration Management systems and diagnostic tools.Its modular and open architecture enables system integrators and end-users to customize and extend the product and to integrate additional third-party applications.
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Microwave System Amplifier, 2 GHz To 8 GHz
87415A
The Keysight 87415A microwave component amplifier brings compact, reliable gain block performance to systems integrators and microwave designers. With 25 dB minimum gain and over 23 dBm output power from 2 to 8 GHz, this amplifier offers output power where it is needed: at the test port.
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High-power DC Electronic Load (6kW~60kW)
FT68200A/AL/E Series
Shenzhen FaithTech Technology Co., Ltd.
FT68200 series high performance high-power DC electronic load provides three voltage ranges 150 V/600 V/1200 V, maximum current 2400 A per single unit, stand-alone power from 4 kW to 60 kW, expandable up to 600 kW, 10000A by master-slave paralleling. Ultra-high power density, 6kW is with only 4U height. Wider operating region, faster dynamic frequency, as well as transient mode, OCP/OPP test, sequence test, automatic test and battery discharge test functions greatly enhances its test strength and expands application coverage. Furthermore, two times instantaneous overpower loading capability can effectively reduces user’s test cost. Built-in standard RS232, RS485, LAN, USB (serial), optional GPIB and CAN interface, supports SCPI, ModBus RTU and CANopen protocol, which facilitates system integrators. FT68200 series has full protection functions, which can be applied to power battery discharge, DC charging station, charging piles, charging pile modules, vehicle On Board chargers (OBC), high-power switching power supplies, power electronics and other power electronics products.
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IEC 61850 Client Simulator
The SimFlex IEC 61850 Client Simulator is an advanced IEC 61850 tool that enables manufacturers, system integrators, utilities and conformance test laboratories to automatically verify IEC 61850 based IEDs. The SimFlex Client Simulator comes with an extensive test suite that implements the test cases defined in IEC 61850-10. Through test scripts that can be individually selected and executed this tool provides a highly flexible and easy to use test environment.
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Modbus Diagnostic Program
Modsak
Modsak is a versatile Modbus diagnostic program. It will be of interest to device manufacturers, software developers, system integrators and field service engineers. Modsak can be used to test or simulate almost any device or system that uses the Modbus protocol: slave devices, PLC's, HMI's, MMI's, DCS's, RTU's, SCADA systems, bridges, gateways, device servers, etc.
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Advanced Serial Protocol Analyzer
Most data networks are complicated, not just the hardware and network issues, but also the high-level protocols that devices use to communicate; and to make things even more complicated, many manufacturers have incorporated proprietary protocols for their devices. Integrating different devices and protocols within a data network is always the most challenging task for system integrators, firmware / software developers, and site engineers. From the simplest loopback test to complicated checksum calculation and sophisticated firmware and GUI software development, the 232Analyzer is designed to tackle all these challenges.
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BGAN Network Emulator
BNE
Square Peg Communications Inc.
The Gatehouse BGAN Network Emulator (BNE) is a test tool developed and optimized to work in concert with the Square Peg BPLT to provide end-to-end emulation of the BGAN Network. The combination of the BPLT and BNE provides an on-the-bench emulation of the I4 satellites, the BGAN Radio Access Network (RAN) and the Core Network (CN). It is a very powerful test solution that enables terminal manufacturers, system integrators and application developers to test their applications thoroughly and consistently and to verify that applications are optimized to work under any network condition thereby providing the best possible user experience.
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Communications & Networking
Curtiss-Wright Defense Solutions
Our field-proven communications and networking solutions provide the core capabilities for secure mobile networks onboard land, sea, and airborne platforms. Leveraging advances in enterprise and data center technology, we design and create our rugged solutions to deliver high-performance connectivity on converged, application-aware networks in disconnected, intermittent, and (DIL) environments. For network security and information assurance, our modules and systems support a variety of secure network management protocols and authentication methods. We rigorously test our solutions to ensure they deliver reliable performance in the most demanding environmental conditions and extended temperatures. Our expertise and experience help system integrators to securely and affordably deploy digital network architectures for enhanced situational awareness (SA) and network-centric operations.
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The Integrated Solution To GNSS + GBAS Functional Testing
GSS4150
To help developers and integrators test the airborne GNSS receiver in their GBAS landing system (GLS), Spirent has developed the GSS4150 solution. The GSS4150 is a VHF signal source generator, supporting multiple different message types, enabling you to build the solutions that power the future of aviation.
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SCL Checker
The SCL checker is a tool that checks SCL files for conformance with the IEC 61850 SCL schema (Edition 1 and Edition 2) and performs various tests on the contents of the SCL file.The SimFlex™ SCL Checker enables utilities, manufacturers, system integrators and conformance test laboratories to automatically verify SCL files.
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In-Circuit Test System Calibrations
Regular calibration is essential to ensure accuracy and reliability in testing. Forwessun offers precise calibration services tailored to your test systems, verifying that all components meet industry standards. Our calibration services maintain peak accuracy and compliance, so you can be confident in your system’s performance for any testing application. Choose from one-off calibrations or scheduled service contracts to meet your needs.- HP3070 - Agilent- Keysight - GenRad- Teradyne
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In-Circuit Test System Rentals
Forwessun offers flexible test system rental options to meet short-term or seasonal testing demands. Our rental systems are rigorously tested for reliability and performance, giving you access to high-quality equipment without the need for a full purchase commitment. Customised rental agreements allow you to return the equipment when it’s no longer required, providing an ideal solution for scaling up production or filling in during periods of high demand.
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In-Circuit Test System Repairs
Forwessun provides expert repair services for a wide range of Test Systems, helping you maintain optimal performance and extend the life of your equipment. Our team of skilled technicians quickly identifies and addresses issues, ensuring that your system is back in operation with minimal downtime. We handle both routine and complex repairs, offering comprehensive solutions to keep your systems running efficiently and reliably.
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In-Circuit Test Systems For Sale
Forwessun offers a comprehensive range of global services for a variety of Test Systems. We provide refurbished systems that have undergone rigorous testing, giving you reliable performance at a fraction of the cost of new equipment. Whether you’re looking for a long-term solution to enhance your testing capabilities or a temporary setup to meet increased production demands, we have flexible options to suit your needs. - HP3070- Agilent - Keysight- GenRad- Teradyne Our bespoke rental agreements make it easy to scale up without permanent investment—simply return the system when it’s no longer required. For ongoing support, we offer calibration, repair, and maintenance services through convenient service contracts. If you’re looking to retire any outdated or non-functional In-Circuit Test (ICT) systems, we’ll offer fair market prices, helping you maximise value on any surplus equipment.
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In-Line Test System
With an Averna in-line test system, clients boost production/yields, catch defects invisible to the human eye, reduce equipment downtime, and ensure repeatable results.
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Iridium Physical Layer Test Systems
PLTS
Averna has worked with Iridium to ensure you have the right equipment to support their test coverage. The Iridium PLTS verifies product performance to Iridium’s standards. Find out more!
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Laser Diode Burn-in Reliability Test System
58604
The Chroma 58604 is a high density, multi-function, and temperature controlled module for laser diode burn-in and lifetime tests. Each module has up to 256 SMU channels which can source current and measure voltage in various control modes as described below.
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Laser Diode Reliability Burn-In / Life-Test System
58602
Chroma 58602 is a high density, precision multi source measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-in, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, silicon Photonics, photo-diodes and other similar components.
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OLED Lifetime Test System
58131
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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Photodiode Burn-in Reliability Test System
58606
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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Photonics Module Test System
58625
Chroma 58625 provides characterization testing for 3D sensing illumination devices. various test modules are combined for validation testing under precise temperature control.
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Photonics Wafer Probing Test System
58635
The advancement of the photonics device technology continues to enable broader and more demanding applications in the industry.
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Advanced SoC/Analog Test System
3650
Chroma 3650 is an SoC tester with high throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses.
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Advanced SoC/Analog Test System
3650-EX
Chroma 3650-EX is specifically designed for high-throughput and high parallel test capabilities to provide the most cost effective solution for fabless, IDM and testing houses.
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Advanced SoC Test System
3680
The Chroma 3680 is an advanced SoC test system with data rate up to 1Gbps. The Chroma 3680 is capable of conducting parallel tests on multiple chips to meet the digital and analog IC testing requirements, with applications including MCU, digital audio, digital TV, set-top box, DSP, network processor, field programmable gate array (FPGA) and consumer electronics.
